Development of Pulse Magnetization System on Aberration Corrected 1.2-MV Cold Field-Emission Transmission Electron Microscope Toshiaki Tanigaki 1 , Tetsuya Akashi 1 , Akira Sugawara 1 , Kodai Niitsu 2 , Xiuzhen Yu 2 , Yasuhide Tomioka 3 , Daisuke Shindo 2,4 , Yoshinori Tokura 2,5 and Hiroyuki Shinada 1 1. Research & Development Group, Hitachi, Ltd., Hatoyama 350-0395, Japan 2. Center for Emergent Matter Science (CEMS), RIKEN, Wako 351-0198, Japan 3. National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8568, Japan 4. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan 5. Department of Applied Physics and Quantum-Phase Electron Center (QPEC), University of Tokyo, Tokyo 113-8656, Japan Observations of structures and electromagnetic fields at atomic resolution provide critical information for material science and industrial research. A transmission electron microscope (TEM) has advantage in high-resolution observation with capability of seeing inside the sample. In the early days, the spatial resolution of the electron microscope has been improved by increasing accelerating voltages. After realization of aberration corrector, the atomic arrangements became observable using wide range of accelerating voltages. For observing electromagnetic filed at atomic scale using electron holography, we developed 1.2-MV TEM equipped with a cold field-emission gun and a CEOS hexapole spherical aberration corrector. The spatial resolution has reached 0.043 nm at the high-resolution observation conditions, in which the sample is placed in high magnetic field of the objective lens [1]. Under the observation condition, in which the sample is placed in a field-free position for observing magnetic field, the special resolution has been reached 0.21 nm [2]. The observation of magnetic field at atomic resolution using electron holography is expected to be realized, however, the phase resolution of magnetic phase measurement has to be increased around 2π/1000 rad for this goal. The phase resolution of electron holography has been reached 2π/1000 rad in vacuum area [3]. However, the phase resolution of magnetic phase measurement in the sample area has been around 2π/200 rad [4] because of difficulties in data acquisition to separate electrostatic and magnetic contributions in the phase shift of the electron waves. Here we report the development of pulse magnetization system on 1.2- MV TEM for increasing the phase resolution by changing only magnetization direction between two acquisition conditions of electron holograms. Magnetization direction in the sample is reversed by pulse magnetic fields generated by coils placed near both sides of sample holder. The system has been designed to be used with double tilt sample holder or other holders for realizing varieties of observation conditions. The maximum magnetic field at sample position applied by the system was 5200 G. The magnetization reversal in Ba2FeMoO6 thin sample by applying 2600 G was confirmed by electron holography (Figure 1). The central area of the sample was observed at higher magnification by electron holography and magnetization reversals were repeated 140 times for reducing statistical noise in the phase measurements. The magnetic phase image and its profiles are shown in Figure 2. The phase noise in the magnetic phase measurements was evaluated by assuming constant magnetization, which gives linear phase profile. The obtained phase noise of 2π/2990 rad corresponds to the phase resolution of 1702 doi:10.1017/S1431927616009351 Microsc. Microanal. 22 (Suppl 3), 2016 © Microscopy Society of America 2016 https://doi.org/10.1017/S1431927616009351 Published online by Cambridge University Press