Low-Cost TSH (Through-Silicon Hole) Interposers for 3D IC Integration
John H. Lau, Ching-Kuan Lee, Chau-Jie Zhan, Sheng-Tsai Wu, Yu-Lin Chao, Ming-Ji Dai, Ra-Min Tain, Heng-Chieh Chien,
Chun-Hsien Chien, Ren-Shin Cheng, Yu-Wei Huang, Yuan-Chang Lee, Zhi-Cheng Hsiao, Wen-Li Tsai, Pai-Cheng Chang,
Huan-Chun Fu, Yu-Mei Cheng, Li-Ling Liao, Wei-Chung Lo, and Ming-Jer Kao
Electronic and Optoelectronic Research Lab, Industrial Technology Research Institute
Rm.168, Bldg.14, No.195, Sec. 4, Chung Hsing Road Chutung, Hsinchu 310, Taiwan
886-3591-3390; johnlau@itri.org.tw
ABSTRACT
In this investigation, a SiP (system-in-package) which
consists of a very low-cost interposer with through-silicon
holes (TSHs) and with chips on its top- and bottom-side (a
real 3D IC integration) is studied. Emphasis is placed on the
fabrication of a test vehicle to demonstrate the feasibility of
this SiP technology. The design, materials, and process of the
top-chip, bottom-chip, TSH interposer, and final assembly
will be presented. Shock and thermal cycling tests will be
preformed to demonstrate the integrity of the SiP structure.
INTRODUCTION
One of the applications of 3D IC integration is passive
interposer or called 2.5D IC integration [1-3]. In general, it
consists of a piece of device-less silicon with TSVs (through-
silicon vias), RDLs (re-distribution layers), and/or IPDs
(integrated passive devices) supporting one or more high-
performance, high-density, and fine-pitch chips without TSVs
[4-12]. This is schematically shown in the top drawing of
Figure 1. It can be seen that the TSV/RDL interposer is
supporting Chip-1 and Chip-2 side-by-side on its top surface.
Another design is shown in the bottom drawing of Figure 1. It
can be seen that the interposer is supporting these two chips
on its top- and bottom-side. In this case, the size of the
interposer can be smaller (or more chips can be placed on the
same size of interposer), and the electrical performance can be
better because the chip-to-chip interconnects are face-to-face
instead of side-to-side [13-22]. Also, it is truly a 3D IC
integration with a passive interposer, which will be the focus
of this study.
TSV/RDL Interposer
3D IC Integration with Passive Interposer
2.5D IC Integration with Passive Interposer
Micro Bump
TSV
Micro Bump
TSV
TSV/RDL
Interposer
Chip-2
Chip-1
Chip-1
Chip-2
Advantages:
Smaller size of
interposer (or same
size of interposer
supporting more chips)
Better electrical
performance (face-to-
face interconnects
instead of side-by-side
3D IC integration
Fig. 1 3D IC integration with a passive interposer.
Organic Package Substrate
Solder
bump
RDL
RDL
RDL
RDL RDL
Cu wire or pillar
Micro Solder joints
RDL
chip
Through-Si Holes (TSH)
Interposer
Non-metallization holes on
the TSH interposer
chip chip
chip
Solder
bump
Solder
ball
Solder
ball
Printed Circuit Board
Not-to-Scale
Underfill is needed between the TSH interposer and package substrate. Underfill may be needed between the
TSH interposer and chips.
Fig. 2 A SiP which consists of a TSH interposer
supporting chips with Cu pillars on its top-side and chips
with solder bumps on its bottom-side.
TSV is the heart and most important key enabling
technology of 3D IC integration. Usually, there are six key
steps in making a TSV, namely: (a) via formation by either
deep reactive ion etch (DRIE) or laser drilling, (b) dielectric
layer by plasma-enhance chemical vapor deposition
(PECVD), (c) barrier and seed layers by physical vapor
deposition, (d) via Cu-filling by electroplating, (e) chemical-
mechanical polishing (CMP) to remove the overburden Cu,
and (f) TSV Cu reveal by backgrinding, Si dry-etching, low-
temperature passivation, and CMP. Thus, how to make low-
cost TSVs is one of the important research topics for 3D IC
integration. In this study, a class of very low-cost interposer
with through-silicon holes (TSHs) and with chips on its both
sides (a real 3D IC integration) is developed.
Figure 2 schematically shows a SiP with a TSH interposer
supporting a few chips on its top- and bottom-side. The key
feature of TSH interposers is there is not metallization in the
holes and the dielectric layer, barrier and seed layers, via
filling, CMP for removing overburden copper, and Cu
revealing are not necessary. Comparing to the TSV
interposers, TSH interposers only need to make holes (by
either laser or DRIE) on a piece of silicon wafer. Just like the
TSV interposers, RDLs are needed by the TSH interposers.
The TSH interposers can be used to support the chips on
its top side as well as bottom side. The holes can let the
signals of the chips on the bottom-side transmit to the chip on
the top-side (or vice versa) through the Cu pillars and solders.
The chips on the same side can communicate to each other
with the RDLs of the TSH interposer. Physically, the top
chips and bottom chips are connected through Cu pillars and
micro solder joints. Also, the peripherals of all the chips are
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