Title Effects of alternating current voltage amplitude and oxide capacitance on mid-gap interface state defect density extractions in In0.53Ga 0.47As capacitors Author(s) Monaghan, Scott; O'Connor, Éamon; Povey, Ian M.; Sheehan, Brendan J.; Cherkaoui, Karim; Hutchinson, Barry J. A.; Hurley, Paul K.; Ferdousi, Fahmida; Rios, Rafael; Kuhn, Kelin J.; Rahman, Anisur Publication date 2013-01-09 Original citation MONAGHAN, S., APOS, CONNOR, É., POVEY, I. M., SHEEHAN, B. J., CHERKAOUI, K., HUTCHINSON, B. J. A., HURLEY, P. K., FERDOUSI, F., RIOS, R., KUHN, K. J. & RAHMAN, A. 2013. Effects of alternating current voltage amplitude and oxide capacitance on mid- gap interface state defect density extractions in In0.53Ga0.47As capacitors. Journal of Vacuum Science & Technology B, 31, 01A119. doi: 10.1116/1.4774109 Type of publication Article (peer-reviewed) Link to publisher's version http://scitation.aip.org/content/avs/journal/jvstb/31/1/10.1116/1.4774109 http://dx.doi.org/10.1116/1.4774109 Access to the full text of the published version may require a subscription. Rights © 2013 American Vacuum Society, AIP Publishing. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in Journal of Vacuum Science & Technology B, 31, 01A119. and may be found at http://scitation.aip.org/content/avs/journal/jvstb/31/1/10.1116/1.4774 109 Item downloaded from http://hdl.handle.net/10468/3038 Downloaded on 2018-12-06T22:50:55Z