PP
Unified Testing and Security Framework for Wireless
Network-on-Chip Enabled Multi-Core Chips
ABHISHEK VASHIST, Rochester Institute of Technology, USA
ANDREW KEATS, Rochester Institute of Technology, USA
SAI MANOJ PUDUKOTAI DINAKARRAO, George Mason University, USA
AMLAN GANGULY, Rochester Institute of Technology, USA
On-chip wireless interconnects have been demonstrated to improve the performance and energy consumption
of data communication in Network-on-Chips (NoCs). However, the wireless interfaces (WIs) can be defective,
rendering these broken links severely afect the performance. This makes manufacturing test of the WIs critical.
While analog testing of the transceivers is possible, such methodologies are impractical in a Wireless NoC
(WiNoC) due to large overheads. In addition to testing, security is another prominent challenge in WiNoCs, as
the security breach can happen due to embedded hardware Trojans or through external attacker exploiting the
wireless medium. The typical security measures used in general wireless networks are not practical in a WiNoC
due to unique network architectures and performance requirements of such a system. However, both testing
and security defense can potentially leverage a basic monitoring framework which, can detect malfunctions
or anomalies. Based on this idea, we propose a unifed architecture for testing and attack detection and
protection of on-chip wireless interconnects. We adopt a Built-In-Self Test (BIST) methodology to enable
online monitoring of the wireless interconnects which can also be reused for monitoring the security threats.
We focus on manufacturing defects of the WIs for testing and persistent jamming attack for the security
measures, as this kind of attack is most likely on wireless communication systems. The BIST methodology is
capable of detecting faults in the wireless links with a low aliasing probability of 2.32 × 10
-10
. Additionally,
the proposed unifed architecture is able to detect the persistent jamming with an accuracy of 99.87% and
sufer < 3% communication bandwidth degradation even in the presence of attacks from either internal or
external sources.
CCS Concepts: · Security and privacy → Embedded systems security; Denial-of-service attacks;
Hardware-based security protocols;
Additional Key Words and Phrases: Network-on-Chip, Wireless Interconnect, Security, DoS, Jamming, Machine
learning
ACM Reference Format:
Abhishek Vashist, Andrew Keats, Sai Manoj Pudukotai Dinakarrao, and Amlan Ganguly. 2019. Unifed Testing
and Security Framework for Wireless Network-on-Chip Enabled Multi-Core Chips. ACM Trans. Embedd.
Comput. Syst. 37, 4, Article PP (November 2019), 20 pages. https://doi.org/10.1145/nnnnnnn.nnnnnnn
Authors’ addresses: Abhishek Vashist, av8911@rit.edu, Rochester Institute of Technology, 83 Lomb Memorial Drive,
Rochester, New York, 14623, USA; Andrew Keats, axk7655@rit.edu, Rochester Institute of Technology, 83 Lomb Memorial
Drive, Rochester, New York, 14623, USA; Sai Manoj Pudukotai Dinakarrao, spudukot@gmu.edu, George Mason University,
4400 University Drive, Fairfax, Virginia, 22030, USA; Amlan Ganguly, axgeec@rit.edu, Rochester Institute of Technology, 83
Lomb Memorial Drive, Rochester, New York, 14623, USA.
This article appears as part of the ESWEEK-TECS special issue and was presented in the International Conference on
Hardware/Software Codesign and System Synthesis (CODES+ISSS), 2019.
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https://doi.org/10.1145/nnnnnnn.nnnnnnn
ACM Trans. Embedd. Comput. Syst., Vol. 37, No. 4, Article PP. Publication date: November 2019.