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Micropipes in silicon carbide crystals:
Do all screw dislocations have open cores?
William M. Vetter and Michael Dudley
Department of Materials Science and Engineering, State University of New York at Stony Brook,
Stony Brook, New York 11794-2275
(Received 16 December 1999; accepted 12 May 2000)
Micropipes in a 6H–SiC semiconductor wafer were studied by scanning electron and
atomic force microscopy. The screw dislocations intersecting the wafer’s surface were
located by etch pitting, and their Burgers vectors determined by x-ray topography. The
etch pits were eroded into smooth craters by ion beam etching to expose levels of
dislocation line from inside the sample’s bulk. There a micropipe’s diameter is distant
from surface relaxation effects. Hollow cores (micropipes) were observed at the base
of the craters whose screw dislocations had Burgers vectors of magnitude three
multiples of the c-lattice parameter and higher. Screw dislocations with 1c and 2c
Burgers vectors had no associated micropipes.
Silicon carbide devices are primarily fabricated
through deposition of SiC epilayers on SiC substrates.
1
The most important defects that invariably occur in
physical vapor transport (PVT)-grown SiC boules are
micropipes.
2
These are the hollow cores of screw dislo-
cations with large Burgers vectors, integral multiples of
the c-lattice parameter of the SiC crystal.
3
The hollow
cores extend along the growth direction of the crystal.
Semiconductor wafers cut from these boules have holes
in them, visible under an optical microscope. The densi-
ties of these micropipes vary between 10 and 10
3
cm
-2
.
4
The presence of micropipes in high voltage diodes
has been shown to cause their failure under reverse bias
conditions.
5
X-ray topography shows screw dislocations occurring
in commercially available SiC wafers in densities be-
tween 10
3
and 10
5
cm
-2
. These possess a range of Burg-
ers vectors. Those with the smallest, which have no
optical-microscopically visible micropipes, are most
prevalent. These are not considered as detrimental to de-
vice performance as the micropipes, without the micro-
pipes’ combination of larger Burgers vector and hollow
dislocation core. Therefore, it is an important question
whether or not these smallest dislocations, whose Burg-
ers vectors equal the c-lattice parameter of the crystal,
have hollow cores whose widths lie below the resolution
limit of optical microscopy.
There has been a series of theoretical calculations of
widths of micropipes under different equilibrium condi-
tions, using various approximations, over past decades.
The first and simplest was published by Frank, who
calculated the radius of a cylinder that a screw disloca-
tion should have in an infinite crystal at equilibrium.
6
According to Frank’s pediction, when the surface free
energy of the interior cylindrical surface equals the in-
crease in free energy used to create the hollow core, the
diameter is
D 4 mb
2
/4p
2
g ,
where m is the shear modulus and g is the surface energy
of the material. Quantities derived from this relation are,
of course, dependent on the value of m/g.
Later, various other theoreticians predicted that, below
a critical strain level or supersaturation, the formation
of a hollow core is not thermodynamically favored and
that the core radius varies with the degree of supersatu-
ration during growth conditions.
7–9
Srolovitz calculated
that where a dislocation intersects a surface, the hollow
core will flare into a catenoid, or trumpet-shaped pit; the
equilibrium radius changing with the distance from its
surface intersection.
10
Funnel-shaped pits have been
seen to occur on the growth surfaces of SiC crystals.
11
It
is important to note that Srolovitz’ calculations show
that smaller trumpet-shaped pits may appear at a growth
surface–dislocation intersection in cases where the Burg-
ers vector of the dislocation is too small to form a hollow
core in the bulk of the crystal.
J. Mater. Res., Vol. 15, No. 8, Aug 2000 © 2000 Materials Research Society 1649