Cognitive Outline Study of Electroencephalogram Signal Patterns Towards Monitoring and Analyzing Sleep Behavioural Disorders Shivam Tiwari, Deepak Arora, and Puneet Sharma Abstract A better consciousness depends on how well your sleep is. Study shows that, sleep disorder become a crucial problem day by day due to work pressure and other different causes. This continuous lack of sleep or uneven sleep pattern can cause to develop different major health issues in humans. These sleep patterns are difficult to detect, analyze, and experience as they exhibit at the time when people are in their deep sleep phase. This research work is focused on studying, methods for analyzing and identifying different sleep patterns based on EEG patterns. Every stage of sleep shows a different electroencephalogram pattern. These EEG patterns show that sleep can be observed as a combination of different cyclic sleep stages. This work shows different sleep stage patterns analysis found in different sleep disorders. Based on these patterns, monitoring of quality sleep can be performed. In this paper, authors have discussed 10–20 electrodes systems to capture brain signals, electroencephalogram signals, and its categorization. This study also represent the detailed description of several methods identified for monitoring sleep behavioural patterns in order to understand the experimental basis and forming a strong theoretical background towards analyzing these EEG signals. Keywords RAM · NRAM · Electroencephalogram · Sleep stages · Quality sleep S. Tiwari (B ) · D. Arora · P. Sharma Department of Computer Science and Engineering, Amity School of Engineering and Technology, Amity University, Lucknow Campus, India e-mail: shivam.tiwari.info@gmail.com D. Arora e-mail: deepakarorainbox@gmail.com P. Sharma e-mail: puneetgrandmaster@gmail.com © Springer Nature Singapore Pte Ltd. 2021 R. P. Mahapatra et al. (eds.), Proceedings of 6th International Conference on Recent Trends in Computing, Lecture Notes in Networks and Systems 177, https://doi.org/10.1007/978-981-33-4501-0_38 409