Accepted Manuscript Thickness-dependent magnetotransport properties and terahertz response of topological insulator Bi 2 Te 3 thin films Phuoc Huu Le, Po-Tsun Liu, Chih Wei Luo, Jiunn-Yuan Lin, Kaung Hsiung Wu PII: S0925-8388(16)32861-4 DOI: 10.1016/j.jallcom.2016.09.109 Reference: JALCOM 38943 To appear in: Journal of Alloys and Compounds Received Date: 2 August 2016 Revised Date: 7 September 2016 Accepted Date: 10 September 2016 Please cite this article as: P.H. Le, P.-T. Liu, C.W. Luo, J.-Y. Lin, K.H. Wu, Thickness-dependent magnetotransport properties and terahertz response of topological insulator Bi 2 Te 3 thin films, Journal of Alloys and Compounds (2016), doi: 10.1016/j.jallcom.2016.09.109. This is a PDF file of an unedited manuscript that has been accepted for publication. As a service to our customers we are providing this early version of the manuscript. The manuscript will undergo copyediting, typesetting, and review of the resulting proof before it is published in its final form. Please note that during the production process errors may be discovered which could affect the content, and all legal disclaimers that apply to the journal pertain.