Supporting Information Carrier Density-Dependent Localized Surface Plasmon Resonance and Charge Transfer Observed by Controllable Semiconductor Content Xin-Yuan Zhang a,b,c , Donglai Han d , Ning Ma c , Renxian Gao c , Aonan Zhu c , Shuang Guo c , Yongjun Zhang c , Yaxin Wang c , Jinghai Yang c, *, and Lei Chen c, * a Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, P.R. China b University of Chinese Academy of Sciences, Beijing 100049, P.R. China c Key Laboratory of Functional Materials Physics and Chemistry of the Ministry of Education, Jilin Normal University, Changchun 130103, P.R. China d School of Materials Science and Engineering, Changchun University of Science and Technology, Changchun, 130022, P.R. China * To whom correspondence should be addressed. E-mail: jhyang1@jlnu.edu.cn; chenlei@jlnu.edu.cn