Surface Composition and Electrical and Electrochemical Properties of
Freshly Deposited and Acid-Etched Indium Tin Oxide Electrodes
Michael Brumbach, P. Alex Veneman, F. Saneeha Marrikar,
²
Thomas Schulmeyer,
‡
Adam Simmonds,
§
Wei Xia,
|
Paul Lee, and Neal R. Armstrong*
Department of Chemistry, UniVersity of Arizona, Tucson, Arizona 85721
ReceiVed June 13, 2007. In Final Form: July 24, 2007
We compare the near-surface composition and electroactivity of commercial indium tin oxide (ITO) thin films,
activated by plasma cleaning or etching with strong haloacids, with ITO films that have been freshly deposited in
high vacuum, before and after exposure to the atmosphere or water vapor. Conductive-tip AFM, X-ray photoelectron
spectroscopy (XPS), and the electrochemistry of probe molecules in solution were used to compare the relative degrees
of electroactivity and the near-surface composition of these materials. Brief etching of commercial ITO samples with
concentrated HCl or HI significantly enhances the electrical activity of these oxides as revealed by C-AFM. XPS was
used to compare the composition of these activated surfaces, focusing on the intrinsically asymmetric O 1s line shape.
Energy-loss processes associated with photoemission from the tin-doped, oxygen-deficient oxides complicate the
interpretation of the O 1s spectra. O 1s spectra from the stoichiometric indium oxide lattice are accompanied by
higher-binding-energy peaks associated with hydroxylated forms of the oxide (and in some cases carbonaceous impurities)
and overlapping photoemission associated with energy-loss processes. Characterization of freshly sputter-deposited
indium oxide (IO) and ITO films, transferred under high vacuum to the surface analysis environment, allowed us to
differentiate the contributions of tin doping and oxygen-vacancy doping to the O 1s line shape, relative to higher-
binding-energy O 1s components associated with hydroxyl species and carbonaceous impurities. Using these approaches,
we determined that acid activation and O
2
plasma etching create an ITO surface that is still covered with an average
of one to two monolayers of hydroxide. Both of these activation treatments lead to significantly higher rates of electron
transfer to solution probe molecules, such as dimethyferrocene in acetonitrile. Solution electron-transfer events appear
to occur at no more than 4 × 10
7
electroactive sites per cm
2
(each with diameters of ca. 50-200 nm) (i.e., a small
fraction of the geometric area of the electrode). Electron-transfer rates correlate with the near-surface tin dopant
concentration, suggesting that these electroactive sites arise from near-surface tin enrichment.
Introduction
The optimization of transparent conducting oxides (TCO) as
indicator electrodes for chemical sensors and as the transparent
bottom contact electrode for electrochromic displays, organic
light-emitting diodes (OLEDs), and organic photovoltaic cells
(OPVs) is a critical part of the development of these new
technologies.
1-26
One of the most important limitations of TCOs
is the fact that the surface chemical and electrical properties of
both indium tin oxide (ITO) and fluorine- or antimony-doped tin
oxide (FTO, ATO) are quite heterogeneous.
4,5,12-19,25-32
In
electroanalytical applications where the TCO electrode functions
as a potentiometric or amperometric sensor, enhancements in
* To whom correspondence should be addressed. E-mail: nra@
u.arizona.edu. Tel: (520) 621-8242.
²
Current address: Huntsman Chemical Co., Longview, Texas.
‡
Current address: Advanced Mask Technology Center, Dresden,
Germany.
§
Current address: Sion Power Corp., Tucson, Arizona.
|
Current address: Veeco/Digital Instruments, Santa Barbara, California.
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10.1021/la701754u CCC: $37.00 © 2007 American Chemical Society
Published on Web 09/20/2007