Mat. Res. Bull. Vol. II, pp. 9Z7-93Z, 1976. Pergamon Press, Inc. Printed in the United States. CRYSTAL GROWTH AND CHARACTERIZATION OF SEVERAL PLATINUM SULFOSELENIDES S. Soled and A. Wold Department of Chemistry and Division of Engineering, Brown University Providence, Rhode Island 02912 and O. Gorochov Laboratoire de Chlmle Min~rale, Facult~ de Phar~acie Paris, 6 eme, France (Received June I, 1976; Refereed) AB STRAC T Both powder and single crystal samples of several phases of composition PtSe2_xS x 2~x~0 were prepared by either sealed tube techniques or chemical vapor transport using phosphorus as the transport agent. The phases were chamacterized by x-ray and densltometric techniques. The electrical behavior between 77 ° and 300OK is reported. Introduct ion In the last few years a great deal of interest has been focused on the layered dlchalcogenides, a class of compounds characterized by their highly anisotroplc structure (1,2). However, the platinum derivatives, PtS2, PtSe 2 and PtTe2, which are all reported to crystallize with the CdI 2 structure (3), have not been studied extensively because of the difficulties in the prepa~atlon of homogeneous, well-chamacterlzed single crystals. In previous papers, a method of crystal growth of platinum disulfide and dltell urlde via chemical vapor transport reactions using phosphorus and sulfur as the transport agents was reported (4,5). In this study, the phase region intermediate in composition between platinum disulfide and dlselenlde is investigated. 9Z7