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Copyright: American Scientific Publishers
RESEARCH ARTICLE
Copyright © 2011 American Scientific Publishers
All rights reserved
Printed in the United States of America
Journal of
Nanoscience and Nanotechnology
Vol. 11, 8185–8189, 2011
Diamond Layers Grown by Chemical Vapor Deposition
on NbN Systems and NbN/SiO
2
-Based Devices
S. Orlanducci
1 ∗
, V. Guglielmotti
1
, I. Cianchetta
1
, M. Lucci
2
,
F. Toschi
1
, E. Tamburri
1
, and M. L. Terranova
1
1
Dip. di Scienze e Tecnologie Chimiche and Minima Lab, University of Rome “Tor Vergata”, Via della Ricerca Scientifica
1-00133 Rome, Italy
2
Dip. di Fisica and MINAS Lab, University of Rome “Tor Vergata”, Via della Ricerca Scientifica 1-00133 Rome, Italy
Deposits of individual diamond grains and continuous polycrystalline diamond layers have been gen-
erated by means of a HFCVD technique onto different types of untreated or seeded NbN surfaces.
To test the feasibility of using diamond layers as protective coatings for aerospace applications, we
carried out diamond deposition onto the lithographically defined NbN microelectrodes of a NbN/SiO
2
multifinger device. The morphological and structural features of the diamond deposits and of the
substrates were characterized by FE-SEM, XRD and Raman spectroscopy. The preferential growth
of diamond on the superconductive NbN enables the selective coating of the NbN microstripes
sputtered on the insulating SiO
2
. Moreover the diamond coating procedure is able to preserve the
structural integrity of the substrate material and to retain the shaped architecture of the device. For
the polycrystalline diamond layers grown on NbN a residual stress of −9.8 GPa, largely due to
thermal stress, has been estimated by Raman analysis. The diamond coatings of the NbN-based
architectures result to be mechanically stable.
Keywords: CVD Diamond, NbN, Patterned Substrate.
1. INTRODUCTION
In recent years the technology of low-pressure/low-
temperature CVD synthesis of diamond layers, proposed
in the 80s and now well settled, has been extended to
aerospace applications.
1
The use of diamond as coating material in the spa-
tial technology is indeed extremely attractive for the
mechanical and thermal properties of the diamond phase
(strength, toughness, radiation resistance, hardness).
2
The
proposed application are for re-entry parts of space vehi-
cles, rocket nozzle and propellers for small spacecraft (ion
thrusters).
3–5
Additional applications include the radiation
shielding of electronic components and the heat dissipation
in high-powered electronic devices.
6 7
On the other hand niobium nitride (NbN), due to its
stability and to the superconducting behaviour at relatively
high temperature, is a material with a vast potential for
applications in innovative superconducting devices such as
single photon detector and bolometer.
8 9
In some aerospace
applications, however, the NbN surfaces have been shown
to suffer radiation impact damage and oxidation.
10
∗
Author to whom correspondence should be addressed.
The present study was motivated by the technological
requirement to set a methodology for deposition of dia-
mond layers on NbN-based systems and for the engineered
coating of NbN/SiO
2
-based devices.
2. EXPERIMENTAL DETAILS
The setting of the experimental conditions for the growth
of diamond films on NbN was achieved using as substrates
Si/SiO
2
wafers partially covered by 400 nm thick NbN
layers. The deposition of the NbN layers was realized by
means of DC-RF magnetron sputtering.
In order to compare the diamond growth process on
NbN with respect to the well-known one on SiO
2
, we have
produced patterned substrates by masking a selected area
of the SiO
2
substrate during the NbN sputtering process.
The diamond depositions were performed in a Hot Fil-
ament Chemical Vapor Deposition (HF-CVD) apparatus
using CH
4
/H
2
mixtures activated by a Ta filament heated
at 2100 ± 10
C, and positioned at 10 mm from the
substrates.
11
The experimental optimized parameters are
listed below:
• substrate temperature: 700
C ± 10
C;
• H
2
flow: 198 sccm;
J. Nanosci. Nanotechnol. 2011, Vol. 11, No. 9 1533-4880/2011/11/8185/005 doi:10.1166/jnn.2011.5095 8185