International Journal of Physics (IJP), Volume 1, Issue 1, January- June 2013 1 ELECTRICAL PROPERTIES OF CDS THIN FILMS BY VACUUM EVAPORATION DEPOSITION D KATHIRVEL a* , N SURIYANARAYANAN b , S PRABAHAR c , S SRIKANTH c a* Department of Physics, Kalaignar Karunanidhi Institute of Technology, Coimbatore, India b Department of Physics, Government College of Technology, Coimbatore, India. c Department of Physics, Tamilnadu College of Engineering, Coimbatore, India ABSTRACT Cadmium Sulfide thin films have been deposited on to well cleaned glass substrate in a vacuum of 10 -6 Torr. The thickness of the films has been determined by quartz crystal monitor method. The electrical resistivity measurements were performed at room temperature by four probe method and it shows CdS films with high resistivity. I-V characteristics analyzed with various thickness. Keywords: CdS, Electrical Properties, Electrical resistivity. INTRODUCTION The wide energy gap of CdS semiconductor is one of the most important properties leading to the great experimental interest in these materials. CdS is a suitable window layer for solar cells [1-2] and also finds applications as optical filters and multilayer light emitting diodes [3-4], photo detectors [5-7], TFETs [8-9], gas sensors and transparent conducting semiconductors for optoelectronic devices [10-11]. Various methods are used to deposit CdS thin films [12-14]. Among the vacuum evaporation is an attractive, effective method and the application at enables the deposition of thin films of larger area with good uniformity. The present study reveals the variation of electrical properties of CdS thin films. INTERNATIONAL JOURNAL OF PHYSICS ISSN: (Print) ISSN: (Online) Volume 1, Issue 1, January- June (2013), pp. 01-07 © IAEME: www.iaeme.com/ijp.html IJP © I A E M E