Enhanced Minority Carrier Lifetimes in GaAs/AlGaAs CoreShell Nanowires through Shell Growth Optimization N. Jiang,* , Q. Gao, P. Parkinson, J. Wong-Leung, ,§ S. Mokkapati, S. Breuer, H. H. Tan, C. L. Zheng, J. Etheridge, , and C. Jagadish Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra, ACT 0200, Australia Clarendon Laboratory, Department of Physics, University of Oxford, Parks Road, Oxford, OX1 3 PU, United Kingdom § Centre for Advanced Microscopy, The Australian National University, Canberra, ACT 0200, Australia Monash Centre for Electron Microscopy, Monash University, Victoria 3800, Australia Department of Materials Engineering, Monash University, Victoria 3800, Australia * S Supporting Information ABSTRACT: The eects of AlGaAs shell thickness and growth time on the minority carrier lifetime in the GaAs core of GaAs/AlGaAs coreshell nanowires grown by metalorganic chemical vapor deposition are investigated. The carrier lifetime increases with increasing AlGaAs shell thickness up to a certain value as a result of reducing tunneling probability of carriers through the AlGaAs shell, beyond which the carrier lifetime reduces due to the diusion of GaAl and/or impurities across the GaAs/AlGaAs heterointerface. Interdiusion at the heterointerface is observed directly using high-angle annular dark eld scanning transmission electron microscopy. We achieve room temperature minority carrier lifetimes of 1.9 ns by optimizing the shell growth with the intention of reducing the eect of interdiusion. KEYWORDS: GaAs/AlGaAs, nanowires, minority carrier lifetimes, MOCVD, HAADF-STEM S emiconductor nanowires are investigated as key compo- nents for future optoelectronic devices. 18 With their one- dimensional geometry and the ability to form radial or axial heterostructures, nanowires and their heterostructures show signicant advantages over their planar counterparts and thus a potential for creating high performance devices, such as solar cells, 2,4,6,7,9,10 photodetectors, 1113 light-emitting diodes, 14,15 transistors, 8 and lasers. 8,16 IIIV semiconductors, with their direct band gap and high electron mobility, are excellent materials for advanced optoelectronic devices. Among the III V semiconductor nanowires, GaAs/(Al,Ga)As coreshell nanowires are prime candidates for investigation, 17,18 since they are lattice-matched materials and planar GaAs/AlGaAs heterostructures have been extensively studied and used in the electronics and optoelectronics industries. 14,15,19 To match the internal quantum eciency achieved by state- of-the-art GaAs-based planar optoelectronic devices, a high- quality GaAs/AlGaAs heterointerface is required in GaAs/ AlGaAs coreshell nanowires to reduce surface recombination velocity (SRV) and obtain long room temperature minority carrier lifetimes (τ mc ). 1921 Due to the high surface-to-volume ratio in nanowires, the electronic properties such as carrier lifetimes and mobility are extremely sensitive to the surface and interface states. Research on planar structures has shown that an almost surface-eect-freeGaAs epilayer with a SRV of only 50 cm/s and microsecond τ mc can be achieved by replacing the free GaAs surface with a GaAs/AlGaAs heterointerface. 22,23 However, the longest τ mc in GaAs/AlGaAs coreshell nano- wires are still in the nanosecond regime. 2426 Both the growth techniques 25 and the nanowire crystal structure 2729 are reported to inuence carrier lifetimes in GaAs/AlGaAs core shell nanowires. The eect of the AlGaAs shell, on the other hand, has not yet been extensively studied. However, orders of magnitude dierence in τ mc have been observed between nanowires diering only in their AlGaAs shell growth temperature in our previous study. 24 Thus, to be able to produce high-quality GaAs nanowires suitable for device applications, it is important to understand the eect of shell growth parameters on the structural and optoelectronic properties of the nanowires. To obtain a high-quality AlGaAs layer, a high process temperature is very important, particularly for growth utilizing metalorganic chemical vapor deposition (MOCVD). 20,24 Compared with GaAs grown under similar conditions, AlGaAs typically leads to higher O impurity incorporation arising from the trimethylaluminium precursor. 30 Furthermore, the stronger AlC (65 kcal/mol) bond energy in comparison to GaC (57.5 kcal/mol) bond energy also results in a higher level of background C incorporation. 31,32 Compositional uniformity is a further issue because of the dierence in diusion length Received: June 27, 2013 Revised: September 14, 2013 Letter pubs.acs.org/NanoLett © XXXX American Chemical Society A dx.doi.org/10.1021/nl4023385 | Nano Lett. XXXX, XXX, XXXXXX