Fast infrared imaging spectroscopy technique (FIIST) M. Romano a,⇑ , C. Ndiaye a , A. Duphil a , A. Sommier a , J. Morikawa c , J. Mascetti b , J.C. Batsale a , L. Servant b , C. Pradere a, * a I2M, Département TREFLE, UMR CNRS 5295 – site ENSAM, Esplanade des Arts et Métiers, 33405 Talence Cedex, France b ISM, Institut des Sciences Moléculaires, UMR CNRS 5255, Université de Bordeaux, 351 cours de la Libération, 33405 Talence cedex, France c Tokyo Institute of Technology, Department of Organic and Polymeric Materials, Tokyo, Japan highlights  Development of a novel infrared imaging spectroscopy technique.  Focal plane array spectral characterization.  Comparison of spectra with a reference spectrometer.  Fast infrared imaging spectroscopy technique (FIIST). article info Article history: Received 12 November 2014 Available online 9 December 2014 Keywords: Infrared thermography Imaging Spectroscopy Focal plane array (FPA) abstract We describe an infrared multispectral imaging spectrometer capable of monitoring up to 76,800 spectra in less than 3 min. In this article, measurements collected using this set-up are presented and discussed, emphasizing the resolution (spatial and temporal), accuracy and capabilities of the instrument. Finally, some applications of multispectral imaging are presented. Ó 2014 Elsevier B.V. All rights reserved. 1. Introduction An infrared multispectral imaging spectrometer is an instru- ment that can simultaneously record spectral, spatial and temporal information of a sample by measuring the intensity variation of a signal due to molecular vibrations. Objects are composed of vibrat- ing atoms, and some of these atoms have higher energy and vibrate more frequently. The vibration of all charged particles and atoms generates electromagnetic waves. When the temperature of an object increases, the vibration of the atoms becomes faster, and thus, the spectral radiant energy rises. As a result, all radiation emitted by the object is a function of the wavelength distribution according to the temperature. This type of information is of partic- ular interest because chemical and thermal properties of materials are strongly coupled in many applications. Chemical characteriza- tion is typically achieved by using analytical spectroscopy methods. Most of these techniques have proved to be well suited for quantitative measurements; moreover, the techniques allow for characterization by scanning the surface of a sample. This scan- ning technique is difficult to use due to problems associated with transient characteristics. As a result, considerable efforts have been made in the past few years to develop multispectral imaging instruments [1–6]. Also some recent work which takes into account the time-resolved coupled conducto-radiative heat trans- fer and the temperature of experiments [7]. The main objective remains to be able to read the chemical content at each pixel of an image by visualizing the sample composition. In this respect, infrared (IR) spectroscopy has characteristic advantages, such as high speed (one minute or less per sample); non-destructive, non-intrusive character; high penetration of the probing radiation beam; suitability for on-line use; and nearly universal application. The combination of these characteristics with instrumental control and data treatment allow for the expansion of the domain of IR technology [8–10]. Many studies concerning the evaluation of near-infrared (NIR) spectroscopic imaging as a tool have been pub- lished with respect to pharmaceutical applications [11], food [12], polymers [13] characterization and even to quantify hydrated sil- ica on Mars [14]. In addition, other breakthroughs have been reported by using high-resolution infrared imaging systems for medical applications [15]. In this type of system, the thickness of http://dx.doi.org/10.1016/j.infrared.2014.12.005 1350-4495/Ó 2014 Elsevier B.V. All rights reserved. ⇑ Corresponding authors. E-mail addresses: romano@enscbp.fr (M. Romano), c.pradere@i2m.u-bordeaux1.fr (C. Pradere). Infrared Physics & Technology 68 (2015) 152–158 Contents lists available at ScienceDirect Infrared Physics & Technology journal homepage: www.elsevier.com/locate/infrared