A modified DOI-based method to statistically estimate the depth of investiga- tion of dc resistivity surveys John Deceuster, Ad´ ela¨ ıde Etienne, Tanguy Robert, Fr´ ed´ eric Nguyen, Olivier Kaufmann PII: S0926-9851(14)00037-8 DOI: doi: 10.1016/j.jappgeo.2014.01.018 Reference: APPGEO 2422 To appear in: Journal of Applied Geophysics Received date: 24 January 2013 Accepted date: 24 January 2014 Please cite this article as: Deceuster, John, Etienne, Ad´ ela¨ ıde, Robert, Tanguy, Nguyen, Fr´ ed´ eric, Kaufmann, Olivier, A modified DOI-based method to statistically estimate the depth of investigation of dc resistivity surveys, Journal of Applied Geophysics (2014), doi: 10.1016/j.jappgeo.2014.01.018 This is a PDF file of an unedited manuscript that has been accepted for publication. As a service to our customers we are providing this early version of the manuscript. The manuscript will undergo copyediting, typesetting, and review of the resulting proof before it is published in its final form. Please note that during the production process errors may be discovered which could affect the content, and all legal disclaimers that apply to the journal pertain.