Sensors and Actuators B 126 (2007) 120–125
Covalent grafting of ion-exchanging groups on porous
silicon for microsystem applications
E. M´ ery
a,∗
, S.A. Alekseev
b
, V.N. Zaitsev
b
, D. Barbier
a
a
Laboratoire de Physique de la Mati` ere, LPM, UMR CNRS-5511, INSA de Lyon, 7 Avenue Jean-Capelle, Bˆ at. Blaise Pascal, 69621 Villeurbanne Cedex, France
b
Chemistry Department, Kiev National Taras Shevchenko University, 60 Vladimirskaya St., 01033 Kiev, Ukraine
Available online 13 December 2006
Abstract
We report the chemical functionalization of porous silicon (PS) by trimethylammoniumpropyl bromide (–(CH
2
)
3
N(CH
3
)
3
+
Br
-
) and alkylsulfonic
acid (–C
x
H
2x
SO
3
H) groups for microsystem components. PS was prepared by electrochemical etching of a p-type silicon wafer. Samples of PS
were first thermally oxidized at 300
◦
C and densified at 500 or 700
◦
C under an inert atmosphere. Mercaptopropyl and trimethylammoniumpropyl
bromide groups were grafted on the PS surface via a silanization procedure. The oxidation of mercapto groups was used for the synthesis of
–C
x
H
2x
SO
3
H groups. The samples were studied by Fourier transform infrared spectroscopy (FT-IR) and temperature-programmed desorption mass
spectrometry (TPD-MS). The grafting of –C
x
H
2x
SO
3
H groups was found to be dependent on the densification treatment of the oxide layer formed
at the surface of PS crystallites by low temperature oxidation. For PS samples thermally oxidized at 300
◦
C, –C
x
H
2x
SO
3
H were not grafted, whereas
for PS samples oxidized and densified at 500 or 700
◦
C, they were successfully grafted. In opposite, the densification treatment of PS samples has
no significant influence on the grafting of –(CH
2
)
3
N(CH
3
)
3
+
Br
-
groups.
© 2006 Elsevier B.V. All rights reserved.
Keywords: Porous silicon; Sulfonic acid; Quaternary ammonium salt; Ion-exchanging groups; Silanization; Surface functionalization
1. Introduction
Over recent years there has been many research works on
porous silicon (PS) for optical devices, chemical and biologi-
cal sensors [1,2], micro-arrays [3], micro-reactors [4,5], DNA
chips [6] or fuel cells [7]. In fact, porous silicon is compati-
ble with silicon-based technologies and exhibits many attractive
properties such as its large surface area (up to 600 m
2
/cm
3
) and
adjustable nanostructure parameters: porosity up to 90% and
pore size between 1 nm and 1 m.
Chemical functionalization of the enormous internal surface
of porous silicon with organic fragments found various attractive
microsystems applications. Two main approaches are usually
used for porous silicon chemical modification: (i) hydrosilyla-
tion, which consists in the reaction of alkenes with silane groups
(SiH
x
with x = 1, 2 or 3) of as-prepared porous silicon under
photochemical or thermal activation [8] and (ii) mild oxidation
of porous silicon which results in the formation of a hydrox-
∗
Corresponding author.
E-mail address: emeline.mery@insa-lyon.fr (E. M´ ery).
ylated SiO
2
layer ready for the silane chemistry modification
commonly applied onto the silica-gel surface [9]. Silica gels
with grafted ion-exchanging groups were successfully applied
for ion-chromatography [10–12], heterogeneous catalysis [13],
solid electrolytes [14], and electrochemical sensors [15,16]. To
our knowledge, grafting of alkylsulfonic acid and quaternary
ammonium salt groups on the surface of the porous silicon was
never described in the literature, and should be very interesting
for the fabrication of on chip ion-chromatography devices, solid
electrolytic membranes and all other above-mentioned appli-
cations. In this paper, we demonstrate how these interesting
functions can be achieved in microcomponents based on oxi-
dized porous silicon layers easily fabricated using standard clean
room processing steps.
2. Experimental
2.1. Porous silicon fabrication and oxidation
Porous silicon was prepared by anodic etching of p
+
-doped
(ρ = 10 m cm) double sides polished silicon (100) wafers.
0925-4005/$ – see front matter © 2006 Elsevier B.V. All rights reserved.
doi:10.1016/j.snb.2006.11.003