Slow progression of dentin bond degradation during one-year water storage under simulated pulpal pressure Renan Belli a,b, * , Neimar Sartori a , Lais Dalmagro Peruchi a , Jackeline Coutinho Guimara˜ es c , E ´ lito Arau ´jo a , Sylvio Monteiro Jr. a , Luiz Narciso Baratieri a , Ulrich Lohbauer b a Department of Dentistry, School of Dentistry, Federal University of Santa Catarina, Floriano ´polis, Santa Catarina, Brazil b Dental Clinic 1, Department of Operative Dentistry and Periodontology, University of Erlangen-Nuremberg, Germany c Department of Prosthodontics, School of Dentistry, Federal University of Espı ´rito Santo, Vito ´ria, Espı ´rito Santo, Brazil j o u r n a l o f d e n t i s t r y 3 8 ( 2 0 1 0 ) 8 0 2 – 8 1 0 a r t i c l e i n f o Article history: Received 31 March 2010 Received in revised form 15 June 2010 Accepted 23 June 2010 Keywords: Durability Degradation Bond Dentin One-step Self-etch Adhesive Simulated Pulpal pressure a b s t r a c t Objectives: To evaluate the dentin bond durability of simplified adhesives after one-year (1 y) under water storage and simulated pulpal pressure. Methods:Class I cavities were prepared in sixty human third molars with the pulpal wall located in mid-coronal dentin. The roots were cut off to expose the pulpal chamber, and the teeth were assembled in a pulpal pressure simulator device. A two-step etch-and-rinse adhesive (Single Bond 2/SB), a two-step self-etch adhesive (Clearfil SE Bond/CSE), a three- step self-etch adhesive (Adper Scotchbond SE/SSE) and three all-in-one adhesives (Adper Easy Bond/EB, Clearfil S 3 Bond/S3 and Adhese One/AO) were applied according to manu- facturers´ instructions. No enamel pre-etching was used for the self-etch systems. The cavities were filled with a composite (Z250, 3M ESPE) in four to five horizontal increments and individually cured. Immediately after the final cure, pulpal pressure was set to 15 cm H 2 O. After 24 h and 1 y under simulate pulpal pressure the teeth were cut following a ‘nontrimming’ microtensile test technique (n = 30) and tested in tension.Kruskall–Wallis and post hoc multiple comparisons were used at a = 0.05. Weibull statistics was applied to SB, CSE and EB. Fractographic analysis of debonded specimens was performed using scanning electron microscopy. Results: At 24 h and 1 y periods, SB showed higher bond strength means than all the others adhesives tested. CSE was not statistically different from EB at 24 h and from EB and SB at 1 y. EB showed bond strength statistically higher than the other three self-etch adhesives, which were not statistically different from each other at 24 h. AO showed significantly lower bond strength than all tested materials after 1 y. For all adhesives the mean bond strength at 1 y were not statistically different from the values measured at 24 h ( p > 0.05).Shifts in failure mode patterns and Weibull modulus decrease indicate some degree of bond degra- a v a i l a b l e a t w w w . s c i e n c e d i r e c t . c o m journal homepage: www.intl.elsevierhealth.com/journals/jden