electronic reprint Journal of Applied Crystallography ISSN 0021-8898 Combined X-ray diffraction and solid-state 19 F magic angle spinning NMR analysis of lattice defects in nanocrystalline CaF 2 Mahmoud Abdellatief, Matthias Abele, Matteo Leoni and Paolo Scardi J. Appl. Cryst. (2013). 46, 1049–1057 Copyright c  International Union of Crystallography Author(s) of this paper may load this reprint on their own web site or institutional repository provided that this cover page is retained. Republication of this article or its storage in electronic databases other than as specified above is not permitted without prior permission in writing from the IUCr. For further information see http://journals.iucr.org/services/authorrights.html Journal of Applied Crystallography covers a wide range of crystallographic topics from the viewpoints of both techniques and theory. The journal presents papers on the applica- tion of crystallographic techniques and on the related apparatus and computer software. For many years, the Journal of Applied Crystallography has been the main vehicle for the publication of small-angle scattering papers and powder diffraction techniques. The journal is the primary place where crystallographic computer program information is published. Crystallography Journals Online is available from journals.iucr.org J. Appl. Cryst. (2013). 46, 1049–1057 Mahmoud Abdellatief et al. · Lattice defects in nanocrystalline CaF 2