Raman spectroscopy for the investigation of indentation-induced domain texturing in lead zirconate titanate piezoceramics Marco Deluca, a,b, * Rau ´ l Bermejo, a Hannes Gru ¨ nbichler, a,b Volker Presser, c Robert Danzer a,b and Klaus G. Nickel d a Institut fu ¨ r Struktur- und Funktionskeramik, Montanuniversita ¨ t Leoben, Peter Tunner Straße 5, 8700 Leoben, Austria b Materials Center Leoben Forschung GmbH, Roseggerstraße 12, 8700 Leoben, Austria c A. J. Drexel Nanotechnology Institute, Drexel University, 3141 Chestnut Street, Philadelphia, PA 19104, USA d Institute for Geoscience, Eberhard Karls Universita ¨t Tu ¨ bingen, Wilhelmstraße 56, 72074 Tu ¨ bingen, Germany Received 22 February 2010; accepted 26 April 2010 Available online 29 April 2010 The study of the close relationship between crack propagation and domain switching is of extreme importance in the reliability of PbZr 1x Ti x O 3 (PZT) devices. We performed domain imaging in the neighbourhood of indentation cracks on poled and non-poled PZT bulk specimens using polarized micro-Raman spectroscopy. Non-destructive Raman measurements helped to correlate the indentation-induced domain texture with the crack growth resistance on both samples. Hence, polarized micro-Raman spectroscopy offers the potential to locally investigate regions of interest in complex piezoelectric devices. Ó 2010 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved. Keywords: Perovskites; PZT; Raman spectroscopy; Micro-indentation The outstanding electro-mechanical coupling of lead zirconate titanate (PbZr 1x Ti x O 3 , PZT) is due to its structural peculiarities in the neighbourhood of the mor- photropic phase boundary (MPB) [1–4]. These properties are exploited for the production of high-precision piezo- electric devices. One of the most common applications is constituted by PZT-based multilayer piezoelectric actua- tors (MPAs) used to control modern fuel injection sys- tems [5,6]. Reliability problems in MPAs are generally related to the fact that such structures are prone to crack- ing and delamination, both during initial poling of the pie- zoelectric material and during service [7,8]. It is known that the growth of cracks in piezoceram- ics such as PZT is strongly influenced by the ferroelastic effect. During crack propagation, ferroelectric domains tend to align with the direction of the tensile stress pres- ent at the crack tip. The domains will re-orient them- selves perpendicular to the crack propagation direction. This domain switching process consumes elas- tic energy, thus reducing the energy release rate for fur- ther crack propagation [9–14]. As a result, cracks parallel to the poling direction of a PZT are significantly shorter than cracks propagating perpendicularly (for the same applied load) [9–12]. Numerous attempts have been made to correlate crack growth resistance (CGR) in PZT with its poling state by means of notched speci- mens and micro-indentations in dependence of applied load and temperature [11–16]. The main difficulty in these studies has always been associated with the lack of a reliable method to locally investigate the poling state of very-small-grain piezoceramics such as PZT. For instance, surface sensitive techniques such as piezor- esponse force microscopy (PFM) [17] are generally suit- able for the investigation of ferroelastic switching in large-grain piezoceramics. Neutron diffraction [18,19] seems promising, but its rather broad lateral resolution hinders its application on micro-sized piezoceramic lay- ers. In this regard, polarized micro-Raman spectroscopy has been recently used for domain analysis and imaging in PZT polycrystals, directly or in the neighbourhood of Vickers indentations [20–24]. This technique has the advantage of being easy to use (compared to synchro- tron X-ray, for instance [25,26]) with high spatial resolu- tion and capability to penetrate the transparent PZT material for several tens of microns. In this work, we provide experimental analysis of domain orientation using Raman spectroscopy around 1359-6462/$ - see front matter Ó 2010 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved. doi:10.1016/j.scriptamat.2010.04.040 * Corresponding author. Tel.: +43 3842 402 4113; fax: +43 3842 402 4102; e-mail: marco.deluca@mcl.at Available online at www.sciencedirect.com Scripta Materialia 63 (2010) 343–346 www.elsevier.com/locate/scriptamat