Sociodemographic Correlates of Knowledge About Elite Deviance Cedric Michel & Kathleen M. Heide & John K. Cochran Received: 1 July 2014 /Accepted: 13 September 2014 # Southern Criminal Justice Association 2014 Abstract Elite deviance is a complex social phenomenon whose understanding re- quires a modicum of knowledge about various disciplines (e.g., financial economics, accounting, politics, environmental law, etc.). Consequently, public awareness of this type of offense is expected to correlate positively with one’ s general level of education. It is uncertain what other sociodemographic characteristics may be associated with knowledge about crimes of the powerful. In the present study, 408 participants com- pleted an online questionnaire that measured (1) their sociodemographic characteristics and (2) their knowledge about elite deviance. Significant variation was found among participants in their level of knowledge about elite deviance, acceptance of “truths” and adherence to “myths” with respect to gender, race/ethnicity, education, political ideol- ogy, religious affiliation, and source of information. More knowledgeable subjects were found to be those who identified as Whites, with higher education levels, without any religious affiliation, and who used the Internet as their main source of information. In comparison, less knowledgeable participants and “myth” adherers turned out to be predominantly male, politically more conservative, Republican, conservative Protes- tant, and who relied on traditional media sources rather than the Internet. These findings and their implications are discussed. Keywords Sociodemographic correlates . Knowledge . Elite deviance . White-collar crime Am J Crim Just DOI 10.1007/s12103-014-9276-0 C. Michel (*) Department of Criminology and Criminal Justice, University of Tampa, 401, W. Kennedy Blvd, Tampa, FL 33606-1490, USA e-mail: cmichel@ut.edu K. M. Heide : J. K. Cochran Department of Criminology, University of South Florida, 4202 E. Fowler Ave, SOC 107, Tampa, FL 33620-8100, USA K. M. Heide e-mail: kheide@usf.edu J. K. Cochran e-mail: cochran@usf.edu