Synthetic Metals 160 (2010) 2061–2064
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Synthetic Metals
journal homepage: www.elsevier.com/locate/synmet
Improved device performance based on crosslinking of poly (3-hexylthiophene)
Manoj Gaur
a
, Jaya Lohani
b
, R. Raman
b
, V.R. Balakrishnan
b
, P. Raghunathan
c
, S.V. Eswaran
a,∗
a
St. Stephen’s College, University of Delhi, Delhi 110007, India
b
Solid State Physics Laboratory, Lucknow Road, Delhi 110054, India
c
National Brain Research Centre, Manesar 122050, India
article info
Article history:
Received 6 April 2010
Received in revised form 14 July 2010
Accepted 20 July 2010
Available online 21 August 2010
Keywords:
Poly (3-hexylthiophene)
Crosslinkers
Bisazides
Diode devices
abstract
Diode devices (glass/ITO/polymer/Al) have been fabricated using poly (3-hexylthiophene) (P3HT)
crosslinked with two different biaryl crosslinkers. Crosslinking was performed by exposing the thin films
with different wt% of crosslinker to UV irradiation and progress of crosslinking was monitored by IR spec-
troscopy. An increase in hole mobility of two orders of magnitude has been observed after crosslinking.
© 2010 Elsevier B.V. All rights reserved.
1. Introduction
Poly (3-hexylthiophene) (P3HT) has emerged as one of the most
widely studied conjugated materials for electronic device applica-
tions due to its good film forming properties, strong absorption and
high hole mobilities. P3HT has been used for various device applica-
tions such as fabrication of memory devices [1], thin film transistors
(TFTs) [2,3], photovoltaic devices [4–8], optoelectronic devices [9]
and for the preparation of biosensors [10,11]. Hole mobility is an
important parameter especially for photovoltaic applications. Hole
mobilities of regioregular P3HT have been reported to be in order
of 10
-5
cm
2
V
-1
s
-1
as calculated from space charge limited cur-
rent (SCLC) method [12–15]. However, in highly ordered films high
field-effect mobilities in the range of 0.1–1 cm
2
V
-1
s
-1
have been
achieved [16].
The structural, optical and electrical properties of conjugated
materials are governed by the extent of inter- as well as intra-
chain delocalization of -orbitals. In solid state, dense packing of
the polymer chains can allow overlap to occur in three-dimension.
This 3D-electronic connectivity creates low resistivity pathways for
the charge carrier to travel and hence dense chain packing with
better overlap of -orbitals can lead to high electrical conductiv-
ity. Since past few years, instead of synthesising new materials,
the focus has shifted on the development of newer strategies to
increase hole mobilities. Some of the approaches employed in this
respect involves increasing molecular weight and decreasing poly-
∗
Corresponding author. Tel.: +91 11 27667462.
E-mail address: sv.eswaran@gmail.com (S.V. Eswaran).
dispersity [17,18], introduction of conjugated bridges in polymer
backbone [19,20], doping [21], blending with different materials
[22,23] and thermal crosslinking by modifying the polymer side
chains and heating at high temperatures [24].
In continuation of our earlier work on crosslinking of aryl azides
[25–27] and use of biaryls [28] for electronic device applications,
we report here crosslinking of P3HT with two new biaryl based
bisazides. This simple and novel approach can be used as an alter-
native strategy for better device performance.
2. Experimental
2.1. Materials and methods
Chemicals and solvents were purchased from Merck or S.D.
Fine Chemicals. Regioregular P3HT (∼87 kDa) was purchased from
Sigma–Aldrich Chemical Co. and used without any additional
purification. Purification of compounds was done by column chro-
matography over silica gel (60–120 mesh) with a gradient elution
using hexane with increasing proportions of ethyl acetate. Melting
points were measured on an electrothermal melting point appa-
ratus and are uncorrected. Optical measurements were done on a
CARY-5E UV-Vis-NIR spectrophotometer on a quartz substrate. IR
spectra were recorded on Spectrum BX series spectrophotometer
using KBr or Nujol (for compounds) and on GaAs substrate for film
state.
1
H and
13
C NMR spectra were recorded on Bruker AVANCE
300 MHz instrument. Mass spectra were recorded on Waters Micro-
analysis LCT Mass spectrometer (Model No. KC455). Film thickness
was measured by SENTECH SE500 ellipsometer and AFM. AFM
measurements were carried out on a Veeco CP II instrument in non-
0379-6779/$ – see front matter © 2010 Elsevier B.V. All rights reserved.
doi:10.1016/j.synthmet.2010.07.023