doi: 10.1149/2.009202ssl 2012, Volume 1, Issue 2, Pages Q20-Q22. ECS Solid State Lett. K-I Na, S. Cristoloveanu, W. Xiong, J-H Lee and Y. Bae Fabricated on SOI Substrate Impact of Gate Misalignment in Triple-Gate MOSFETs service Email alerting click here box at the top right corner of the article or Receive free email alerts when new articles cite this article - sign up in the http://ssl.ecsdl.org/subscriptions go to: ECS Solid State Letters To subscribe to © 2012 The Electrochemical Society www.esltbd.org address. Redistribution subject to ECS license or copyright; see 211.223.202.95 Downloaded on 2012-07-26 to IP