Slim edges in double-sided silicon 3D detectors This content has been downloaded from IOPscience. Please scroll down to see the full text. Download details: IP Address: 173.254.233.237 This content was downloaded on 01/10/2013 at 14:33 Please note that terms and conditions apply. 2012 JINST 7 C01015 (http://iopscience.iop.org/1748-0221/7/01/C01015) View the table of contents for this issue, or go to the journal homepage for more Home Search Collections Journals About Contact us My IOPscience