See discussions, stats, and author profiles for this publication at: https://www.researchgate.net/publication/224362444 A Built-In Self-Test (BIST) Technique for Single- Event Testing in Digital Circuits Article in IEEE Transactions on Nuclear Science · January 2009 DOI: 10.1109/TNS.2008.2006499 · Source: IEEE Xplore CITATION 1 READS 296 7 authors, including: Some of the authors of this publication are also working on these related projects: Mutual constraints between Higgs and gravity View project Evaluation of a new compact voting latch View project Balaji Narasimham 54 PUBLICATIONS 881 CITATIONS SEE PROFILE Robert Shuler NASA 46 PUBLICATIONS 189 CITATIONS SEE PROFILE Daniel Loveless University of Tennessee at Chattanooga 63 PUBLICATIONS 451 CITATIONS SEE PROFILE All content following this page was uploaded by Robert Shuler on 29 November 2016. The user has requested enhancement of the downloaded file.