See discussions, stats, and author profiles for this publication at: https://www.researchgate.net/publication/237328576 Modification of the refractive index and the dielectric constant of silicon dioxide by means of ion implantation Article in Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · May 2000 DOI: 10.1016/S0168-583X(99)00650-3 CITATIONS 10 READS 12 4 authors, including: J.W. Swart 148 PUBLICATIONS 444 CITATIONS SEE PROFILE Jéssica Diniz Federal University of Pernambuco 95 PUBLICATIONS 451 CITATIONS SEE PROFILE All content following this page was uploaded by J.W. Swart on 31 October 2014. The user has requested enhancement of the downloaded file.