See discussions, stats, and author profiles for this publication at: https://www.researchgate.net/publication/2354022 Self-Diagnosis of Grid-Interconnected Systems, with Application to Self-Test of VLSI Wafers Article · June 1999 Source: CiteSeer CITATIONS 9 READS 13 2 authors, including: Stefano Chessa Università di Pisa 154 PUBLICATIONS 2,170 CITATIONS SEE PROFILE All content following this page was uploaded by Stefano Chessa on 20 July 2013. The user has requested enhancement of the downloaded file. All in-text references underlined in blue are added to the original document and are linked to publications on ResearchGate, letting you access and read them immediately.