See discussions, stats, and author profiles for this publication at: https://www.researchgate.net/publication/253877612 A single-shot intensity-position monitor for hard X-ray FEL sources Article in Proceedings of SPIE - The International Society for Optical Engineering · September 2011 DOI: 10.1117/12.893740 CITATIONS 13 READS 61 12 authors, including: Some of the authors of this publication are also working on these related projects: X ray scattering View project Yiping Feng Stanford University 98 PUBLICATIONS 1,488 CITATIONS SEE PROFILE Jan Moritz Feldkamp Technische Universität Dresden 39 PUBLICATIONS 751 CITATIONS SEE PROFILE Henrik Till Lemke Stanford University 55 PUBLICATIONS 840 CITATIONS SEE PROFILE Sooheyong Lee Korea Research Institute of Standards and Scie… 62 PUBLICATIONS 1,180 CITATIONS SEE PROFILE All content following this page was uploaded by Yiping Feng on 21 March 2014. The user has requested enhancement of the downloaded file. All in-text references underlined in blue are added to the original document and are linked to publications on ResearchGate, letting you access and read them immediately.