* Corresponding author. Tel.: #91-020-5655201; fax: #91-020-5655201. E-mail address: mgt@physics.unipune.ernet.in (M.G. Takwale). Solar Energy Materials & Solar Cells 64 (2000) 333}346 Synthesis of highly conductive boron-doped p-type hydrogenated microcrystalline silicon (c-Si:H) by a hot-wire chemical vapor deposition (HWCVD) technique S.R. Jadkar, Jaydeep V. Sali, M.G. Takwale*, D.V. Musale, S.T. Kshirsagar School of Energy Studies, Department of Physics, University of Pune, Ganeshkhind, Pune 411 007, India Physical and Materials Chemistry Division, NCL, Pashan Raod, Pune 411 007, India Received 15 April 2000 Abstract Boron-doped hydrogenated microcrystalline silicon (c-Si:H) "lms were prepared using hot-wire chemical vapor deposition (HWCVD) technique. Structural, electrical and optical properties of these thin "lms were systematically studied as a function of B H gas (diborane) phase ratio (Variation in B H gas phase ratio, dopant gas being diluted in hydrogen, a!ected the "lm properties through variation in doping level and hydrogen dilution). Characterization of these "lms from low angle X-ray di!raction and Raman spectroscopy revealed that the high conductive "lm consists of mixed phase of microcrystalline silicon embedded in an amorphous network. Even a small increase in hydrogen dilution showed marked e!ect on "lm microstruc- ture. At the optimized deposition conditions, "lms with high dark conductivity (0.08 ( cm)) with low charge carrier activation energy (0.025 eV) and low optical absorption coe$cient with high optical band gap ( &2.0 eV) were obtained. At these deposition conditions, however, the growth rate was small (6 A s /s) and hydrogen content was large (9 at%). 2000 Elsevier Science B.V. All rights reserved. Keywords: Microcrystalline silicon; Boron doped; HWCVD; Electrical properties; Structural properties; Optical properties 0927-0248/00/$ - see front matter 2000 Elsevier Science B.V. All rights reserved. PII: S 0 9 2 7 - 0 2 4 8 ( 0 0 ) 0 0 2 1 9 - 1