See discussions, stats, and author profiles for this publication at: https://www.researchgate.net/publication/3137188 Analysis of single-event transients in analog circuits Article in IEEE Transactions on Nuclear Science · January 2001 DOI: 10.1109/23.903817 · Source: IEEE Xplore CITATIONS 99 READS 94 8 authors, including: Some of the authors of this publication are also working on these related projects: Development of High current breakdown models for ESD applications View project Ronald Schrimpf Vanderbilt University 676 PUBLICATIONS 11,094 CITATIONS SEE PROFILE H.J. Barnaby Arizona State University 142 PUBLICATIONS 1,809 CITATIONS SEE PROFILE Ronan Marec Thales Group 29 PUBLICATIONS 302 CITATIONS SEE PROFILE All content following this page was uploaded by Ronald Schrimpf on 01 March 2013. The user has requested enhancement of the downloaded file. All in-text references underlined in blue are added to the original document and are linked to publications on ResearchGate, letting you access and read them immediately.