Characterization of the Mirror Region with Atomic Force Microscopy Sheldon M. Wiederhorn, Jose Cepero * and Jay Wallace National Institute of Standards and Technology Gaithersburg, MD 20899-8500 Jean-Pierre Guin CNRS-University of Rennes I Rennes, France Theo Fett Forschungszentrum Karlsruhe and University of Karlsruhe Karlsruhe, Germany For publication in Ceramic Transactions Under Review September 26, 2006 Keywords: Fractography, Glass, Fracture, Roughness, Crack-Growth, RMS roughness. * Now at the University of Seville, Department of Materials Science, Seville, Spain