NORTH- HOLLAND TECHNICAL NOTE Electronics Manufacturing in 2020: A National Technological University Management of Technology Mini-Delphi DAVID A. CAUFFIEL and ALAN L. PORTER ABSTRACT A Delphi study projects a series of critical changes in electronics manufacturing over the coming quarter- century. These changes imply a need for early planning to adapt production processes to altered materials, integrated products, environmentally conscious processes, different applications, and a markedly different work force. Introduction Early in 1995, Georgia Tech initiated a study on the future of electronics manufactur- ing management under the direction of Michael J. Kelly. At that same time Alan Porter was teaching, and David Cauffiel assisting with, a Georgia Tech graduate class on "Analy- sis of Emerging Technologies," which is also part of the National Technological University (NTU) M.S. Program in Management of Technology (MOT). ~We enlisted participants in two MOT cohorts in a small-scale Delphi (survey with repetition) to explore the future of electronics manufacturing. Results are not definitive, but they are thought-provoking as these future-oriented technology managers anticipate some profound changes in elec- tronics manufacturing. NTU reflects a consortium of some 46 participating universities providing graduate courses to more than 100 organizations. The NTU MOT Program enlists about 30 mid-career professionals each year, sponsored mainly by large corporations where they work, in a 2-year, satellite-transmitted program of 12 courses with interspersed residences. For information contact Tina Kellogg, NTU, 700 Centre Ave, Ft. Collins, CO 80526-1842. DAVID A. CAUFFIEL is in the Industrial and Systems Engineering (ISyE) Ph.D. program at Georgia Tech, Atlanta, Georgia. ALAN L. PORTER is professor in ISyE and Public Policy, Georgia Tech, Atlanta, Georgia. Address correspondence to Alan Porter, ISyE, Georgia Tech, Atlanta, GA 30332-0205 or e-mail: alan.porter@isye.gatech.edu Technological Forecasting and Social Change 51, 185-194 (1996) © 1996 Elsevier Science Inc. 655 Avenue of the Americas, New York, NY 10010 0040-1625/96/$15.00 SSDI 0040-1625(95)00224-X