Author’s Accepted Manuscript Determination of the optical Constants and film thickness of ZnTe and ZnS thin films in terms of spectrophotometric and spectroscopic ellipsometry Deo Prakash, A.M. Aboraia, M. El-Hagary, E.R. Shaaban, K.D. Verma PII: S0272-8842(15)01998-7 DOI: http://dx.doi.org/10.1016/j.ceramint.2015.10.096 Reference: CERI11543 To appear in: Ceramics International Received date: 29 September 2015 Revised date: 18 October 2015 Accepted date: 19 October 2015 Cite this article as: Deo Prakash, A.M. Aboraia, M. El-Hagary, E.R. Shaaban and K.D. Verma, Determination of the optical Constants and film thickness of ZnTe and ZnS thin films in terms of spectrophotometric and spectroscopic e l l i p s o m e t r y, Ceramics International http://dx.doi.org/10.1016/j.ceramint.2015.10.096 This is a PDF file of an unedited manuscript that has been accepted fo publication. As a service to our customers we are providing this early version o the manuscript. The manuscript will undergo copyediting, typesetting, and review of the resulting galley proof before it is published in its final citable form Please note that during the production process errors may be discovered which could affect the content, and all legal disclaimers that apply to the journal pertain www.elsevier.com/locate/ceri