http://www.iaeme.com/IJECET/index.asp 60 editor@iaeme.com International Journal of Electronics and Communication Engineering and Technology (IJECET) Volume 8, Issue 4, July-August 2017, pp. 60–67, Article ID: IJECET_08_04_008 Available online at http://www.iaeme.com/IJECET/issues.asp?JType=IJECET&VType=8&IType=4 ISSN Print: 0976-6464 and ISSN Online: 0976-6472 © IAEME Publication IMPLEMENTATION OF RIPPLE CARRY ADDER USING ADVANCED MULTILAYER THREE INPUT XOR GATE (TIEO) TECHNIQUE IN QCA TECHNOLOGY Mohammad Mahad Research Student, Department of ETC, G.H.Raisoni College of Engineering, Pune, India Manisha Waje Assistant Professor, Department of ETC, G.H.Raisoni College of Engineering, Pune, India ABSTRACT In the present era, transistor reached their highest density and cannot go much smaller than their present size. There are many designs of QCA adders are present in literature, this is new multilayered schematic layout of adder based on QCA technology. In QCA main emphasis on the area and delay reduction leads to an efficient adder design. The proposed adder have less hardware complexity, such as number of cell , delay and total area .QCA designer is the software used form layout generation and simulation results are shown using the coherence vector engine in the same software. Keywords: full adder, quantum dot cellular automata, three inputs XOR (TIEO) Gate. Cite this Article: Mohammad Mahad and Manisha Waje, Implementation of Ripple Carry Adder Using Advanced Multilayer Three Input XOR Gate (TIEO) Technique in QCA Technology. International Journal of Electronics and Communication Engineering and Technology, 8(4), 2017, pp. 60–67. http://www.iaeme.com/IJECET/issues.asp?JType=IJECET&VType=8&IType=4 1. INTRODUCTION QCA is the technology uses arrays of quantum dot cellular automata cells. These arrays of quantum-dot devices, and basic concepts were introduced by Tougaw and Lent in 1993[1]. It has a unique feature that logic states are not stored in voltage levels as in conventional electronics, but they are represented by a cell. A cell is a nano –scale device capable of encoding data by two-electron configuration. The cells must be aligned precisely at nano- scales to provide correct functionality, thus, the proper testing of these devices for manufacturing defects and misalignment plays a major role for quality of circuits [2]