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Article
Journal of
Nanoscience and Nanotechnology
Vol. 18, 100–103, 2018
www.aspbs.com/jnn
Tuning Wall Thicknesses in Mesoporous Silica Films for
Optimization of Optical Anti-Reflective Properties
Nawfel Abdullah
1
, Md. Shahriar A. Hossain
1
, Konstantin Konstantinov
1
, Hirofumi Tanabe
2
,
Mikiya Matsuura
2
, Kazuhiko Maekawa
2
, Amanullah Fatehmulla
3
, Wazirzada Aslam Farooq
3
,
Md. Tofazzal Islam
4
, Yoshio Bando
5
, Yusuf Valentino Kaneti
5 ∗
, and Yusuke Yamauchi
1 5 ∗
1
Australian Institute for Innovative Materials (AIIM), University of Wollongong, Squires Way, North Wollongong, NSW 2500, Australia
2
Kuraray Co., Ltd., 41 Miyukigaoka, Tsukuba, Ibaraki 305-0841, Japan
3
Department of Physics and Astronomy, College of Science, King Saudi University, Riyadh 11451, Saudi Arabia
4
Department of Biotechnology, Bangabandhu Sheikh Mujibur Rahman Agricultural University, Gazipur 1706, Bangladesh
5
International Center for Materials Nanoarchitechtonics (MANA), National Institute for Materials Science (NIMS),
1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
This work reports the fabrication of mesoporous silica films with controllable wall thicknesses by
spin coating of precursor solutions consisting of polystyrene-block-polybutadiene-block-polystyrene
based triblock copolymers (Hydrogenated methyl Styrene Ethylene Butadiene methyl Styrene,
HmSEBmS) and tetraethyl orthosilicate (TEOS) followed by calcination in air at 600
C, for optical
anti-reflection films. By changing the relative weight of the triblock polymer to TEOS, the pore-to-
pore distance in the mesoporous silica film can be controlled without significantly affecting the size
of the mesopores, thus, enabling effective control of the refractive index and porosity of the films.
In terms of optical properties, the transmittance of the fabricated mesoporous silica film is approx-
imately 3.3% higher than that of the uncoated glass substrate in the wavelength range of 400 to
750 nm.
Keywords: Mesoporous Materials, Mesoporous Films, Silica, Anti-Reflective Films, Optical
Properties.
1. INTRODUCTION
Controlling the morphology of mesoporous silica materi-
als is critical for optimizing their functional applications.
Among various morphologies, continuous mesoporous sil-
ica films are quite useful for optical applications, because
of their high transparency.
1
Mesoporous silica films are
commonly prepared by solvent evaporation methods which
enable coating of well-ordered mesoporous layers onto
various substrates, such as glass and plastic substrates.
2–4
They have attracted great interests in optical applications
due to their low dielectric constant and low refractive
index as well as their high porosity and high thermal
and mechanical stabilities.
5 6
To date, several types of
mesoporous silica films with different pore structures have
shown excellent low dielectric properties and an ultra-low
refractive index.
∗
Authors to whom correspondence should be addressed.
An anti-reflection (AR) coating is a type of optical coat-
ing which is applied to the surface of lenses and other
optical devices in order to reduce reflectivity.
7–9
In order to
enhance the anti-reflection properties, an AR film having a
low refractive index is desired. However, the conventional
solvent evaporation method generally requires precise opti-
mization of the experimental conditions, such as controls
of temperature and humidity, selection of templates, sol-
vent compositions etc. Recently, several reports have been
published on the use of mesoporous silica nanoparticles
for anti-reflection films, but careful modifications of the
internal and external surfaces of nanoparticles and proper
selection of the matrix for the dispersion of nanoparticles
is important.
10
To date, anti-reflection films have been prepared by
spray deposition, electrodeposition, chemical vapour depo-
sition, physical vapour deposition, and so on. Wet-
chemical methods are very convenient for practical
100 J. Nanosci. Nanotechnol. 2018, Vol. 18, No. 1 1533-4880/2018/18/100/004 doi:10.1166/jnn.2018.14558