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International Journal of Polymeric Materials and Polymeric Biomaterials, 63: 1- 5
Copyright © 2014 Taylor & Francis Group, LLC
ISSN: 0091-4037 print / 1563-535X online
DOl: 10.1080/ 00914037.2013.854242
C\ Taylor & Francis
Taylor&. FrancisGroup
Atomic Force Microscopy as a Characterization Tool
for Contact Lenses: Indentation Tests and Grain Analysis
MUSTAFA OGUZHAN CAGLAYAN
Nanotechnology Engineering Department, Cumhuriyet University, Sivas, Turkey
Received 30 July 2013, Accepted 29 September 2013
Nondestructive methods for testing mechanical properties of soft contact lenses allow quality control and testing to be performed
on same sample by considering various parameters. A novel alternative to conventional mechanical test technique for contact lenses
is presented implementing atomic force microscopy (AFM) and force spectroscopy (FS) technique as pica-indentation and
mechanical characterization tool. This technique gives nN force resolution with producing nm range el as tic deformation. FS
and AFM topography results are ev alu ated simultaneously to compare mechanical and topographical properties of contact lenses
such as Young's modulus, grain size evaluation, surface roughness, and adhesion force. Mechanical properties of soft contact lenses
were reported by considering equilibrium water content of contact lens.
Keywords: AFM, force spectroscopy, grain analysis, Pica-indentation, soft contact lenses
1. Introduction
Mechanical properties of soft contact lens materials are
important for manufacturing considerations and user com-
fort. Clinical performances such as on-eye movement, fitting,
and wettability, as well as occurrence of complications may
be influenced by these mechanical properties [1]. Stresses in
the lens materials imposed by repeated application and
external forces during the application, handling, and
ma nuf acturing process result loss of optical performance
or even user discomfort. Ability to maintain original physi-
cal dimensions, or return to its original shape after applied
external forces, is an important characteristic of a contact
lens material. There are several forces acting on a contact
lens during production or handling. Tighe [2] noted that ten-
sile strength is relevant the general durability and resistance
to handling of a contact lens. Eyelid motion, however, pro-
duces the shear and compressive force that is quite different
type of deformation [2] . Elastic modulus of contact lens will
become a significant parameter when thicker and larger lens
is used (i.e., an increase of about 17% thickness and 8% in
diameter produces 100% increase in the stiffness of a lens)
[3]. Although the impact of elastic modulus of a contact lens
to its mechanical properties is significant, there are little pub-
lished work is available on the measurement of mechanical
properties hydrogels used for contact lens production.
Address correspondence to: Mustafa Oguzhan Caglayan,
Cumhuriyet University Nanotechnology Engineering Department,
58140 Sivas, Turkey. E- mail: caglayanmoguzhan@grnail.com
Color versions of one or more of the figures in the article can be
found online at www.tandfonline.com/ GPOM .
Nondestructive methods for mechanical testing of contact
lens allow for multiple tests to be performed on the same
sample, which will simplify testing for manufacturing and
quality control purposes. However, test methods for hydro-
gels are poorly defined mainly because the materials need to
be in standard shape when testing in conventional mechan-
ical tester [4].
Besides its versatility in the topographic measurement
applications, AFM is able to detect intermolecular forces
with a spatial resolution in the atomic-molecular range. This
nanomechanical characterization technique is widely
employed in a broad spectrum of applications such as
electronics, semiconductors, polymers, biology, and bioma-
terials as nondestructive testing method [5 ,6]. Operating
principle of AFM relies on sensing interaction forces that
are generated between the probe and the sample surface
namely electrostatic, electronic, and van der Waals repulsion
that arise at nanometric a nd subnanometric scales [7] .
Pica-indentation by means of AFM -force spectroscopy
(FS) has several advantages over standard methods such as
locality of measurements (i.e., small contact areas between
sample and the probe), availability of multiple measure-
ments on sample surface (i.e., obtaining average mechanical
properties), and characterization of a material at different
penetration depths [8].
In Figure 1, a typical force spectroscopy result (F-z curve,
also known as force curve) is presented. There are typical
responses obtained when an AFM tip moves towards the
sample surface. In Figure 1(a), snap-in process (i.e., jump
to contact) takes place when the AFM probe bends down-
ward due to van der Waals and water meniscus interactions,
which bring the AFM tip into contact with sample surface.
Preview