© November 2018 | IJIRT | Volume 5 Issue 6 | ISSN: 2349-6002 IJIRT 147229 INTERNATIONAL JO URNAL OF INNOVATIVE RESEARCH IN TECHNOLOGY 100 Design and Development of Drop Test Rig & Test Analysis of Handheld Electronic Devices Shubham Agnihotri 1 , Shaunak Vaze 2 , Rajat Nampalliwar 3 , Dr. S.T. Chavan 4 1,2,3 Student, Maharashtra Institute of Technology, Pune 4 Professor, Maharashtra Institute of Technology, Pune Abstract- Portable electronic devices suffer from impact-induced failure in usage. These products must pass drop or impact tests before shipment, so that there are no grievances at the customer end due to poor life of the product. Hence, drop or impact performance is one of the important concerns in product design. Because of the small size of these kind of electronics products, it is very expensive, time-consuming, and difficult to conduct drop tests to detect the failure mechanism and identify their drop behaviors. A large number of sensors are required in the extremely small space of the electronic device, so as to obtain sufficient data for failure analysis. To overcome this hurdle, a combination of only a few sensors, a rudimentary test rig, and finite element analysis with the help of software can be used to study device behavior during impact. Recent work has shown that due to the multiple impacts that result during an accidental drop of a portable electronic product, the propensity for damage to the product can be significantly higher than in a single impact. When viewed in light of these findings, conventional methods for drop-testing of portable products, either constrained or free, suffer from drawbacks. In the former, the object being tested is not allowed to move naturally during impact, and in the latter, it is difficult to control the orientation of the object at impact and to instrument it. In this project, a new method of drop- testing has been designed, that combines the advantages of the constrained and free methods, without their drawbacks. It is proposed that the object being tested be suspended onto a guided drop-table in the precise desired impact orientation. The test device, drop test and correlation of analysis to test data are illustrated in the report. Index Terms- Analysis, Design, Drop, Handheld electronic devices, Impact, Test Rig. I. INTRODUCT ION With many products, it is not a specific technological feature any more that will guarantee a competitive advantage, but more often success is based on other product attributes such as the selected feature set, total quality, design and usability of the product. Besides for these product specific features, the company’s skills in different business operations and strategies, such as in R&D, product development, manufacturing and logistics, play a major role in overall business success. Hence, we come to what has become one of the most important factors in product development; which is functionality. A device must function properly and offer the customer the same services throughout its life cycle. Now that we have established the importance of product functionality in deciding its success in the market, it is important to look at the ways in which said functionality can be tested or verified before the product is launched into the market. This may be related to its physical attributes; which is mainly studied and discussed in this report, or it may be related to its software attributes. The physical attributes of a handheld electronic device include the device housing, its electronic circuits and display screen. Our testing and analysis has been focused on the housing level analysis of the device- the reason being, the first point of contact for transmission of damaging forces is always the housing. How well the housing of the device handles external forces decides whether or not the internal electronic circuits, or external feedback devices will continue to function. II. LITERATURE REVIEW Constrained Drop Testing Constrained drop testing is by far the most common, and it is based on sound fundamentals, and is part of many standardized test protocols. In constrained drop testing, the object being tested is clamped rigidly to a heavy table that is guided along vertical rods (or