Applied Surface Science 449 (2018) 39–47
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Applied Surface Science
jou rn al h om ep age: www.elsevier.com/locate/apsusc
Full Length Article
DC magnetron sputtered aligned ITO nano-rods with the influence of
varying oxygen pressure
T. Arockiadoss
a
, M. Kovendhan
b
, D. Paul Joseph
c,d,∗
, A. Sendil Kumar
e
, Byung Chun Choi
f
,
K.S. Shim
g
a
Department of Physics, Directorate of Distance Education, Madurai Kamaraj University, Madurai, Tamilnadu, 625021, India
b
Department of Environmental Engineering, INHA University, Incheon, 402751, South Korea
c
Department of Physics, National Institute of Technology, Warangal, Telangana, 506004, India
d
Center for Advanced Materials, National Institute of Technology, Warangal, Telangana, 506004, India
e
School of Physics, University of Hyderabad, Gachibowli, Hyderabad, 500046, India
f
Department of Physics, Pukyong National University, Busan, 608 737, South Korea
g
Cooperative Laboratory Center, Pukyong National University, Busan, 608 737, South Korea
a r t i c l e i n f o
Article history:
Received 20 August 2017
Received in revised form
20 November 2017
Accepted 15 December 2017
Available online 21 December 2017
Keywords:
Indium tin oxide
Magnetron sputtering
Texture coefficient
Nanorods
Bandgap and figure of merit
a b s t r a c t
Aligned Nano rods of transparent conducting indium tin oxide (ITO) were deposited on glass substrates
using dc magnetron sputtering technique from an ITO alloy target at two different oxygen pressures
placing the substrates at three different lateral positions inside the chamber. The (4 4 0) oriented ITO thin
films at optimal deposition conditions with high transmittance, low sheet resistance, good crystallinity
and novel morphology was obtained at room temperature deposition. The structural, optical, morpho-
logical, electrical transport behavior and figure of merit imply the need in optimizing the positioning of
the substrates within the chamber during deposition for achieving films of best desired properties.
© 2017 Elsevier B.V. All rights reserved.
1. Introduction
Indium tin oxide (ITO) thin films have been studied extensively
due to its transparent conducting property for usage in a variety
of applications such as flat panel displays, solar cells, heat reflect-
ing windows etc. [1]. ITO is also widely used as anode contact in
organic light-emitting diodes (OLED’s) [2]. There is a large demand
for smooth, novel nanostructured ITO thin films for use in various
emerging devices especially with the rapid advancement of various
smart technologies. Functional ITO thin films have been produced
by a variety of methods, such as rf-magnetron sputtering [3], pulsed
laser deposition [4], spray pyrolysis [5], dc-magnetron sputtering
[6] etc. Though the ITO thin films have been explored quite for a
long period, prepared by many methods, there is no sufficient basic
study in which researchers observe interesting morphology change
over with the location of the substrate during deposition. This moti-
∗
Corresponding author at: Department of Physics, National Institute of Technol-
ogy, Warangal, Telangana State, 506004, India.
E-mail address: palphymail@gmail.com (D. Paul Joseph).
vated us to optimize the sputtering unit for the best location to get
ITO films with desired properties. In the case of dc-magnetron sput-
tering, in-homogeneity in the films depending upon the location of
the substrate placed below the target is often encountered. Litera-
ture reports in general show amorphous nature of ITO films when
deposited at room temperature [7,8] except for few reports with
crystallinity [9,10]. The reactive oxygen pressure and substrate
temperature plays a dominant role on the surface morphology and
high value of transmittance and conductivity [11,12]. In this paper
we demonstrate deposition of nanorods of crystalline ITO at room
temperature (without intentional substrate heating) with varying
morphology with the substrate holder held static below the target
at three different lateral positions and also by varying oxygen pres-
sure. The ITO films were deposited by varying these parameters are
explored for their structural, morphological, optical, transport and
figure of merit properties and the results are discussed.
2. Preparation of target and deposition of films
The ITO target (In
2
O
3
, 90 wt% and SnO
2
, 10 wt% of 99.99% purity)
mixture was taken in a quartz tube and treated at 500
◦
C for 24 h in
https://doi.org/10.1016/j.apsusc.2017.12.129
0169-4332/© 2017 Elsevier B.V. All rights reserved.