Full Terms & Conditions of access and use can be found at http://www.tandfonline.com/action/journalInformation?journalCode=tphb20 Download by: [University of California, San Diego] Date: 24 June 2016, At: 09:06 Philosophical Magazine Part B ISSN: 1364-2812 (Print) 1463-6417 (Online) Journal homepage: http://www.tandfonline.com/loi/tphb20 Structural analysis of TiN x films prepared by reactive-ion-beam-enhanced deposition D. C. Kothari , P. Scardi , S. Gialanella & L. Guzman To cite this article: D. C. Kothari , P. Scardi , S. Gialanella & L. Guzman (1990) Structural analysis of TiN x films prepared by reactive-ion-beam-enhanced deposition, Philosophical Magazine Part B, 61:4, 627-637, DOI: 10.1080/13642819008219298 To link to this article: http://dx.doi.org/10.1080/13642819008219298 Published online: 20 Aug 2006. Submit your article to this journal Article views: 8 View related articles Citing articles: 12 View citing articles