REVIEW PAPER ON PROBING SYSTEM OF CMM Jaldeep Soni 1* , P. D. Pantawane 2 , 1-2 Department Production Engineering and Industrial management, College of Engineering Pune, India *Corresponding author: sonijn18.prod@coep.ac.in Abstract: Probing system is a principle component of CMM which has the function to identify co-ordinate points of the object surface. Numerous types of probing systems are being used on CMM’s depending on functional requirement and machine capability. Different types of probes have been evolved over the years since its early inception in seventies. During the early introduction of CMM hard probs were widely used and machine works like 3-axis milling machine. With the advent of sophisticated electronic and computing systems, new variety of electro-mechanical, electronic and optical probing systems have been evolved. The capability and applications of CMM’s are primarily define d by data acquisition system (probing system) and data processing. Now a day’s connection and non- connection types of probing systems are mostly used for CMMs. This paper reviews the probing systems used on CMM with a particular focus on the test method, materials, measurement techniques, etc. Also, this paper describes the limitations of CMM on micro and nano scale measurement. Keywords :- CMM, Multi-probing, Contact Probe, Non-contact Probe. 1. Introduction Due to evolution in manufacturing techniques product can be manufacture in micro as well as nano scale. The growing demands for exact coordinate measurement on product demand new ideas of probe design. Recent measurement techniques can measure up to 10 nano- meters [11]. Here we are showing machining accuracy with several year. Fig. 1. Machining accuracy graph [5]. The reason behind coordinate measuring machine are becoming more and more important is measurement and authentication of the dimensional superiority of manufactured objects and products. Measuring automation, probable combination with CAD representations, basic data examination and the capability to accomplish facts in workstation have resulted in a very high usefulness of CMMs [9]. The inherent slow speed of CMM contact measurement method is the only reason of its non-suitability for measuring complex parts in reverse engineering, though it is widely used in inspection. In micro and macro measurement, it is difficult to measure the automobiles and their parts and sub millimetre, the precision which is of 1-meter range. To tackle such situations, laser beam probes, vision sensors, etc are some of the non-contact sensors that are developed recently [10]. Also, there are uses of contact probe with some sensors and laser scanners. Yet, no efficient measurement systems are present till date to measure a part with free form and complicated surfaces. Two unsolved problems for measuring complicated parts till date are automatic scanning at any view desirable without discontinuous the positioning and the inspection of the edge, key features and the hidden areas of the non-contact probe. To solve the complexion parts completely and precisely, a multi- probe measuring structure integrated with a CMM is used. [8]. 2. Classification of probes In CMM mostly use two types of probes 1) contact type probe 2) Non-contact type prob. Also, there are so many combinations with contact type probe for measurement in micro and nano-objects. Which is used according to its application and difficulty in measurement. There are use some sensors to convert point data into 3D drawings. 2.1 Touch-Trigger Probe David McMurtry, co-founder of Renishaw, had first invented touch trigger probe in 1970. First, touch- trigger probes were specially designed for measure an Olympus engine used on supersonic Concorde aircraft. For the programmed generation of a inspected point on the object face, the touch-trigger probe permits it, while instantaneously and automatically recording the XYZ position in space of the point taken [2].