[Supporting Information] Scanning Noise Microscopy on Graphene Devices Moon Gyu Sung a† , Hyungwoo Lee a† , Kwang Heo b , Kyung-Eun Byun a , Taekyeong Kim a , David H. Seo d , Sunae Seo d,e , and Seunghun Hong a,b,c * a Department of Physics and Astronomy, Seoul National University, Seoul 151-747, Korea b Interdisciplinary Program in Nano-Science and Technology, Seoul National University, Seoul 151-747, Korea c Department of Biophysics and Chemical Biology (WCU Program), Seoul National University, Seoul 151-747, Korea d Semiconductor Devices Lab., Samsung Advanced Institute of Tech., Yongin-Si, Gyeonggi- do 446-712, Korea e Department of Physics, Sejong University, Seoul, 143-747, Korea *To whom correspondence should be addressed. E-mail: seunghun@snu.ac.kr † These authors contributed equally to this work.