Enhancing Efficiency and Stability of Nanocrystalline
Porous Silicon Electroluminescence by
Surface Treatments
B. Gelloz and N. Koshida
Tokyo University of Agriculture and Technology
Dpt. of Elec. & Elec. Eng., Tokyo Univ. A&T,
Koganei, 2-24-16 Nakacho, Tokyo 184 8588, Japan.
Efficient Si-based light-emitting devices with
low operating voltage are desirable because of their
potential low cost and VLSI-compatibility. Applications
include light sources in general, and optical interconnects
and displays in particular.
Currently, electroluminescence (EL) from
nanocrystalline Si (nc-Si) does not fulfill all the necessary
requirements for display and interconnects purposes. The
external power efficiency (max reported: 0.4 % [1];
needed: >1%) and stability (typical: minutes or hours;
needed: >10
5
hrs) should be enhanced. Furthermore the
operating voltage (best: >5 V [1,2], typical: >10 V)
should be lowered, especially for mobile applications and
interconnects (3-5 V). Finally, the brightness also has to
be improved (typical: <1cd/m
2
; needed: >100 cd/m
2
).
The nc-Si layers are formed by anodization of Si
in HF solutions followed by electrochemical oxidation
performed according to the process described in Ref. 3.
This partial oxidation process is very efficient in
increasing the EL efficiency of the as-prepared nc-Si layer
while preserving most of the original nc-Si passivation by
hydrogen atoms.
We have studied two nc-Si surface treatments in
combination with very thin nc-Si layers in a view to
improve all the EL characteristics of nc-Si (operating
voltage, efficiency, and stability).
The first treatment consists in the deposition of a
few nanometer thick amorphous carbon film onto nc-Si,
prior to the deposition of the semi-transparent top
electrode.
The second surface treatment is a thermally
activated chemical modification of the nc-Si surface,
resulting in the substitution of most hydrogen atoms
terminating nc-Si by covalently attached organic groups.
Various organic molecules have been considered, such as
1-decene, ethyl-undecylenate or n-caprinaldehyde.
Figure 1 shows the current density and the EL
intensity as a function of the voltage for two devices, one
including a carbon film and one without. It is clear that
the incorporation of the film enhances the EL efficiency
due to a reduction in current density and an increase in EL
intensity. A high value of the power efficiency has been
measured (0.34 lm/W) at 3 V for a brightness of 3 cd/m
2
.
This is the best performance ever for an LED based on nc-
Si in terms of efficiency and operating voltage.
The device stability is also enhanced by the
carbon film. This is due to the high chemical stability of
carbon and Si-C bonds at the nc-Si surface. The capping
function of the film is also a factor that should improve
the stability.
In addition, the carbon film enhances the
mechanical and electrical quality of the top contact,
resulting in improved reproducibility.
Figure 2 shows the current density and the EL
intensity as a function of time for a device including a nc-
Si layer which surface has been modified using 1-decene.
The diode current and EL intensity are very stable. This is
because the nc-Si surface is well passivated by covalently
bonded organic groups. For comparison, without the
organic passivation, the EL intensity drops by about one
order of magnitude in 10 min. Therefore, the organic
passivation is very effective in enhancing the stability.
In summary, two surface treatments (carbon film
and nc-Si passivation by organic groups) are very
effective in enhancing the efficiency, reproducibility and
stability of nc-Si LEDs. Furthermore, record performance
has been achieved in term of efficiency and operating
voltage.
References
1. B. Gelloz and N. Koshida, J. Appl. Phys. 88 (7), 4319
(2000 ).
2. A. Loni, A.J. Simons, T.I. Cox, P.D.J. Calcott and L.T.
Canham, Electronics Letters, 31, 1288 (1995)
3. B. Gelloz, T. Nakagawa and N. Koshida, Appl. Phys.
Lett. 73, 14, 2021 (1998).
-2 -1 0 1 2
10
-6
10
-5
10
-4
10
-3
10
-2
10
-1
C included
No C
CURRENT DENSITY (A/cm
2
)
VOLTAGE (V)
10
-9
10
-8
10
-7
10
-6
10
-5
10
-4
EL INTENSITY (Arb. units)
Figure 1 : EL intensity and current density versus voltage
for a device including a carbon film and a device without
any carbon film.
0 5 10 15 20 25 30 35 40
0.00
0.05
0.10
0.15
0.20
CURRENT DENSITY (A/cm
2
)
TIME (min)
0.0
1.0x10
-7
2.0x10
-7
3.0x10
-7
4.0x10
-7
5.0x10
-7
6.0x10
-7
EL INTENSITY (Arb. units)
Figure 2 : EL intensity and current density versus time at
4 V for a device including a carbon film. In addition, the
surface of nc-Si has been passivated using covalently
bonded organic groups (decyl groups in this case).
Abs. 1180, 204th Meeting, © 2003 The Electrochemical Society, Inc.
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