HAL Id: hal-01198584 https://hal.archives-ouvertes.fr/hal-01198584 Submitted on 14 Sep 2015 HAL is a multi-disciplinary open access archive for the deposit and dissemination of sci- entifc research documents, whether they are pub- lished or not. The documents may come from teaching and research institutions in France or abroad, or from public or private research centers. L’archive ouverte pluridisciplinaire HAL, est destinée au dépôt et à la difusion de documents scientifques de niveau recherche, publiés ou non, émanant des établissements d’enseignement et de recherche français ou étrangers, des laboratoires publics ou privés. Study of short-circuit robustness of SiC MOSFETs, analysis of the failure modes and comparison with BJTs Cheng Chen, Denis Labrousse, Stéphane Lefebvre, Mickael Petit, Cyril Buttay, Hervé Morel To cite this version: Cheng Chen, Denis Labrousse, Stéphane Lefebvre, Mickael Petit, Cyril Buttay, et al.. Study of short-circuit robustness of SiC MOSFETs, analysis of the failure modes and comparison with BJTs. Microelectronics Reliability, Elsevier, 2015, pp.6. 10.1016/j.microrel.2015.06.097. hal-01198584