Hyperfine Interactions 108 (1997) 59–72 59 X-ray, visible and electron spectroscopy with the NIST EBIT E. Tak´ acs a,b , L.P. Ratliff a and J.D. Gillaspy a a Atomic Physics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA b Experimental Physics Department, Kossuth University, Bem t´ er 18/a, H-4026 Debrecen, Hungary An overview is given of recent activities at the NIST electron beam ion trap (EBIT) facility. The machine has been operational for almost three years. Important characteristics and demonstrated capabilities of our EBIT are presented. Selected results include experiments with trapped highly charged ions (X-ray and visible spectroscopy), and with extracted ions (ion-surface collision studies). 1. Introduction Activity at the EBIT facility in Gaithersburg, MD at present can be divided into two broad categories. One category is associated with the spectroscopic investigation of the electromagnetic radiation emitted by highly charged ions created and trapped within the machine. In these measurements the ions are studied in situ at the place where they are created. The spectra exhibit the properties of the trap (hot plasma confined by magnetic and electric fields), the interaction between the electrons and the ions (excitation, ionization, and recombination processes), and the ions themselves (atomic structure). The second group of activities are associated with the extracted ions. In this case we use the EBIT as an ion source in which the highly charged species are created and then extracted for outside measurements. The extraction and beam transport is done by several electrostatic ion-optical elements and a magnet, which is used for separating the specific charge-state needed for the experiment. After a brief introduction to the machine, some selected results will be presented to give examples of the latest activities and to illustrate the capabilities of the EBIT laboratory at NIST.  J.C. Baltzer AG, Science Publishers