This document is downloaded from DR-NTU, Nanyang Technological University Library, Singapore. Title Determination of diffusion lengths with the use of EBIC from a diffused junction with any values of junction depths.( Published version ) Author(s) Kurniawan, Oka.; Ong, Vincent K. S. Citation Kurniawan, O., & Ong, V. K. S. (2006). Determination of diffusion lengths with the use of EBIC from a diffused junction with any values of junction depths. IEEE Transactions on Electron Devices, 53(9), 2358-2363. Date 2006 URL http://hdl.handle.net/10220/4658 Rights © 2006 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site.