ELSEVIER Surface Science 339 (1995) 329-336
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surface science
Linear polarization discrimination for in situ
infrared spectroscopy at electrode surfaces
Peter W. Faguy *, Nebojsa S. Marinkovic 1
Department of Chemistry, University of Louisville, Louisville, KY40292, USA
Received 29 March 1995; accepted for publication 19 May 1995
Abstract
Linear polarization absorption ratios are determined from data for carbon monoxide and bisulfate anion adsorbed on Pt
single crystal electrodes and are compared to the extinction coefficient for the wire grid polarizer utilized. The two
adsorbates are at sub-monolayer coverages and have dipole moments, for the IR modes observed, which are normal to the
electrode surface. Thus their intensities provide a direct measure of the available parallel polarized light intensity regardless
of the actual linear polarization state selected. From the relative absorption ratios it is apparent that the linear polarization
discrimination is much less than the predicted values from the polarizer extinction coefficients. The decrease in extinction
efficiency for the in situ measurement as compared to the polarizer response is explained in terms of the polarization rotation
at the window/solution/electrode interface and the relative linear polarization throughput for the spectrometer.
Keywords: Chemisorption; Infrared absorption spectroscopy; Low index single crystal surfaces; Metal-electrolyte interfaces; Platinum;
Reflection spectroscopy;Vibrations of adsorbed molecules
1. Introduction
The application of infrared spectroscopy to prob-
lems of molecular structure at electrode surfaces is
arguably the most useful and versatile hybrid spec-
troelectrochemical technique in use today. Informa-
tion concerning the coverage, structure and orienta-
tion of molecular species on electrode surfaces as
well as the concentration near the electrode can be
obtained [1,2]. The reflection techniques involved
utilizes difference in absorption for orthogonally lin-
* Corresponding author. Fax: + 1 502 852 8149.
Present address: Department of Chemistry, Universityof Cali-
fornia, Davis, USA.
early polarized radiation [3,4]. Differences in parallel
(p-) and perpendicular (s-) mean square electric field
strengths (MSEFS) exist because of the boundary
conditions found for electromagnetic fields at a con-
ductor/dielectric interface [3-7]. This provides the
surface sensitivity inherent to near-grazing angle ex-
ternal [3,4] and critical angle internal [8-10] reflec-
tion techniques. Signal enhancement in the form of
large MSEFS for the parallel polarized light, and
signal discrimination as the rejection of the perpen-
dicularly polarized component to increase signal at
the detector, both are operative in linear polarized
surface reflection spectroscopy. These concepts are
well established and many of the interpretive and
sensitivity considerations can be found in the litera-
ture [1-12].
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