Advances In X-Ray Analysis, Vol. 31 DE88 002120 X-Ray Microscopy Using Collimated and Focussed Synchrotron Radiation K. W. Jones, W. M. Kwiatek, B. M. Gordon, A. L. Hanson, J. G. Pounds Brookhaven National Laboratory, Upton, New York 11973 8.|(5i§'?w M. L. Rivers, S. R. Sutton h»-s"-So University of Chicago, Chicago, Illinois 60637 " >. " A. C. Thompson, J. H. Underwood, R. D. Giauque, and Y. Wu 5 So Lawrence Berkeley Laboratory, Berkeley, California 94720 ^1^ t>^ • » -«d ^m ^ 06 1 g 3 £- £ 5 . 3 = 1 Isl'ssSg-g-ag 1 Presented at ™ 'S | -s. i g-o-i* f 36th Annual Denver X-Ray Conference If t^.^'l I "« o I Denver, Colorado °-J5 ss3-g 1 ^ I ^ > August 3-7, 1987 The submitted manuscript has been authored under Contract DE-AC02-76CHOOO16 with the Office of Basic Energy Sciences, US Department of Energy. Ac lngly, the US Government retains a nonexclusive, royalty-free license to lish or reproduce the published form of this contribution, or allow do so, for US Government purposes. •Ji r