Supplementary information Spectroscopic Evidence for the Origin of Odd-Even Effects in Self-Assembled Monolayers and Effects of Substrate Roughness Jiahao Chen 1,3,4† , Jian Liu 2,† , Ian D. Tevis 1 , Richard S. Andino 2 , Christina M. Miller 2 , Lawrence D. Ziegler 2 , Xin Chen 2 and Martin Thuo 1,4,5 * 1 Department of Materials Science and Engineering, Iowa State University, Ames, Iowa 50011, USA 2 Department of Chemistry and the Photonics Center, Boston University, Boston, MA 02215, USA 3 Division of Materials Science and Engineering, Ames Laboratory, Ames, Iowa 50011 4 Micro-electronic research center, Iowa State University, 133 Applied Sciences Complex I, 1925 Scholl Road, Ames, Iowa 50011 USA 5 Biopolymer and Biocomposites Research Team, Center for Bioplastics and Biocomposites, Iowa State University, Ames, Iowa 50011 USA Electronic Supplementary Material (ESI) for Physical Chemistry Chemical Physics. This journal is © the Owner Societies 2017