Accepted Manuscript EXAFS spectroscopic refinement of amorphous structures of evaporation-de- posited Ge-Se films Yong Gyu Choi, Sang Yeol Shin, Roman Golovchak, Suyoun Lee, Byung-ki Cheong, Himanshu Jain PII: S0925-8388(14)02456-6 DOI: http://dx.doi.org/10.1016/j.jallcom.2014.10.036 Reference: JALCOM 32382 To appear in: Journal of Alloys and Compounds Received Date: 18 June 2014 Revised Date: 3 October 2014 Accepted Date: 6 October 2014 Please cite this article as: Y.G. Choi, S.Y. Shin, R. Golovchak, S. Lee, B-k. Cheong, H. Jain, EXAFS spectroscopic refinement of amorphous structures of evaporation-deposited Ge-Se films, Journal of Alloys and Compounds (2014), doi: http://dx.doi.org/10.1016/j.jallcom.2014.10.036 This is a PDF file of an unedited manuscript that has been accepted for publication. As a service to our customers we are providing this early version of the manuscript. The manuscript will undergo copyediting, typesetting, and review of the resulting proof before it is published in its final form. Please note that during the production process errors may be discovered which could affect the content, and all legal disclaimers that apply to the journal pertain.