Cs
+
Speciation on Soil Particles by TOF-SIMS
Imaging
Gary S. Groenewold,* Jani C. Ingram, Travis McLing, and Anita K. Gianotto
Idaho National Engineering and Environmental Laboratory, Idaho Falls, Idaho 83415-2208
Recep Avci
Image and Chemical Analysis Laboratory, EPS 259, Montana State University, Bozeman, Montana 59717
Soil particles exposed to CsI solutions were analyzed by
imaging time-of-flight secondary ion mass spectrometry
and also by scanning electron microscopy/ energy-disper-
sive X-ray spectroscopy (SEM/ EDS). The results showed
that Cs
+
could be detected and imaged on the surface of
the soil particles readily at concentrations down to 1 6 0
ppm, which corresponds to 0.04 monolayer. Imaging
revealed that most of the soil surface consisted of alumi-
nosilicate material. However, some of the surface was
more quartzic in composition, primarily SiO
2
with little
Al. It was observed that adsorbed Cs
+
was associated with
the presence of Al on the surface of the soil particles. In
contrast, in high SiO
2
areas of the soil particle where little
Al was observed, little adsorbed Cs
+
was observed on the
surface of the soil particle. Using EDS, Cs
+
was observed
only in the most concentrated Cs
+
-soil system, and Cs
+
was clearly correlated with the presence of Al and I. These
results are interpreted in terms of multiple layers of CsI
forming over areas of the soil surface that contain sub-
stantial Al. These observations are consistent with the
hypothesis that the insertion of Al into the SiO
2
lattice
results in the formation of anionic sites, which are then
capable of binding cations.
The characterization of natural or anthropomorphic chemicals
on mineral surfaces is an important topic, because the surface
chemistry exerts a large influence on chemical mobility and
eventual fate. The surface chemistry can be highly variable on a
microscopic scale, and this inhomogeneity can confound charac-
terization efforts. Highly irregular morphological features and
mineral phases that are less than 1 μm across can defeat surface
characterization techniques like reflectance infrared spectroscopy,
and X-ray photoelectron spectroscopy. Consequently, spectro-
scopic imaging investigations of contaminants on natural mineral
surfaces have been few.
Cesium contamination on soil is one system for which
spectroscopic information would be of high interest.
1,2
The 134
and 137 isotopes decay by γ emission and are formed in high
fission yield; the 137 isotope has a moderately long half-life (30
years). The Cs isotopes comprise one of the lasting health
problems from the Chernobyl accident.
3,4
Cs can be highly mobile
in some environments, and geochemically it has many of the same
characteristics as potassium as a consequence of similar ionic radii
in solution.
2
Hence, there is motivation for understanding the
interaction of Cs
+
with naturally occurring mineral surfaces at the
molecular level.
Cs sorption has been extensively investigated, primarily by
using sequential extractions together with γ spectroscopy (for
radioisotopes) or atomic absorption for detection.
1,3-6
This ap-
proach has been applied to the study of Cs contamination on
basalts and smectites,
7
clays (illite, kaolinite),
6,8
and soils.
9
Cs
was shown to prefer the mineral soil horizons in high-organic
soils.
10
From these studies, it has been possible to infer mecha-
nistic details: Cs will tenaciously adhere to adsorption sites and
can be supplanted only by K
+
and NH
4
+
. It appears to prefer
surface “defects”, which have been termed frayed edge, and wedge
sites.
11-13
However, understanding of Cs-soil systems would
benefit from direct spectroscopic information.
The spectroscopic approach in this study utilized an imaging
SIMS instrument
14
for characterization of soil particles that had
been exposed to Cs
+
. SIMS is well suited to the analysis of Cs
+
because it readily forms gas-phase secondary ions. The SIMS
instrument utilizes microfocused primary ion guns, achieving
spatial resolutions of less than 1 μm. The ion optics transmit the
secondary ions through three electrostatic sectors to a channel-
plate detector, such that the spatial information is preserved. The
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Anal. Chem. 1998, 70, 534-539
534 Analytical Chemistry, Vol. 70, No. 3, February 1, 1998 S0003-2700(97)00517-9 CCC: $15.00 © 1998 American Chemical Society
Published on Web 02/01/1998