1
Supporting Information
!
†
School of Materials Science and Engineering, Nanyang Technological University, 50 Nanyang
Avenue, Singapore 639798
*
E’mail: pslee@ntu.edu.sg
Institute of Chemistry, The Hebrew University of Jerusalem Edmond J. Safra Campus,
Jerusalem 9190401, Israel
. (a) XRD of MoO
3
’II flakes (ICDD:471320), (b) SEM micrograph, (c) TEM
micrograph, and inset shows HRTEM micrograph, and (d) AFM topography and inset shows
height profile of the marked flake (thickness ~ 200 nm).